Progress in Transmission Electron Microscopy 1
Progress in Transmission Electron Microscopy 1

Author: Xiao-Feng Zhang

Publisher: Springer Science & Business Media

Published: 2001-10-18

Total Pages: 400

ISBN-13: 9783540676805

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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Scientific and Technical Aerospace Reports
Scientific and Technical Aerospace Reports

Author:

Publisher:

Published: 1994

Total Pages: 652

ISBN-13:

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.