Proceedings of the Sixth Workshop on Electronics for LHC Experiments

Proceedings of the Sixth Workshop on Electronics for LHC Experiments

Author:

Publisher:

Published: 2000

Total Pages: 612

ISBN-13:

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The purpose of the workshop was to review the electronics for LHC experiments and to identify areas and encourage common efforts for the development of electronics within and between the different LHC experiments and to promote collaboration in the engineering and physics communities involed in the LHC activities..


Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017

Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017

Author: Zhen-An Liu

Publisher: Springer

Published: 2018-08-07

Total Pages: 445

ISBN-13: 9811313164

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These two volumes present the proceedings of the International Conference on Technology and Instrumentation in Particle Physics 2017 (TIPP2017), which was held in Beijing, China from 22 to 26 May 2017. Gathering selected articles on the basis of their quality and originality, it highlights the latest developments and research trends in detectors and instrumentation for all branches of particle physics, particle astrophysics and closely related fields. This is the second volume, and focuses on the main themes Astrophysics and space instrumentation, Front-end electronics and fast data transmission, Trigger and data acquisition systems, Machine detectors, Interfaces and beam instrumentation, Backend readout structures and embedded systems, Medical imaging, and Security & other applications. The TIPP2017 is the fourth in a series of international conferences on detectors and instrumentation, held under the auspices of the International Union of Pure and Applied Physics (IUPAP). The event brings together experts from the scientific and industrial communities to discuss their current efforts and plan for the future. The conference’s aim is to provide a stimulating atmosphere for scientists and engineers from around the world.


Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Author: Ronald Donald Schrimpf

Publisher: World Scientific

Published: 2004

Total Pages: 349

ISBN-13: 9812389407

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.


Astroparticle, Particle And Space Physics, Detectors And Medical Physics Applications - Proceedings Of The 8th Conference

Astroparticle, Particle And Space Physics, Detectors And Medical Physics Applications - Proceedings Of The 8th Conference

Author: Emilio Borchi

Publisher: World Scientific

Published: 2004-07-05

Total Pages: 795

ISBN-13: 9814482579

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The exploration of the subnuclear world is carried out through increasingly complex experiments covering a wide range of energies and in a large variety of environments — from particle accelerators and underground detectors to satellites and space laboratories. For these research programs to succeed, novel techniques, new materials and new instrumentation need to be used in detectors, often on a large scale. This book reviews the advances made in all technological aspects of the experiments at various stages.The proceedings have been selected for coverage in:• Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)• Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)• CC Proceedings — Engineering & Physical Sciences