15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics
15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics

Author: Miroslav Miler

Publisher: SPIE-International Society for Optical Engineering

Published: 2007

Total Pages: 472

ISBN-13:

DOWNLOAD EBOOK

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

Author: Jarmila Müllerová

Publisher:

Published: 2017-03-30

Total Pages: 566

ISBN-13: 9781510607330

DOWNLOAD EBOOK

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

Author: Jarmila Müllerová

Publisher: SPIE-International Society for Optical Engineering

Published: 2010

Total Pages: 618

ISBN-13: 9780819482365

DOWNLOAD EBOOK

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.