Characterization of Optical Materials

Characterization of Optical Materials

Author: Gregory J. Exarhos

Publisher: Butterworth-Heinemann

Published: 1993

Total Pages: 232

ISBN-13:

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Focuses on how surface morphology, microstructure, and chemical bonding influence the optical response of a material. Illuminates methods used to characterize thin films, multilayer structures and modified surfaces. Appendices include summaries of characterization techniques specific to optical materials.


Optical Techniques for Solid-State Materials Characterization

Optical Techniques for Solid-State Materials Characterization

Author: Rohit P. Prasankumar

Publisher: CRC Press

Published: 2020-06-30

Total Pages: 748

ISBN-13: 9780367576929

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With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into ma


Practical Materials Characterization

Practical Materials Characterization

Author: Mauro Sardela

Publisher: Springer

Published: 2014-07-10

Total Pages: 242

ISBN-13: 1461492815

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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.


Characterization Techniques and Tabulations for Organic Nonlinear Optical Materials

Characterization Techniques and Tabulations for Organic Nonlinear Optical Materials

Author: Carl W. Dirk

Publisher: Routledge

Published: 2018-05-11

Total Pages: 914

ISBN-13: 135146180X

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""Furnishes table of nonlinear optical properties of organic substances as well as experimental procedures for measuring the nonlinearity of the elements tabulated, including composite materials-offering support for scientists and engineers involved in characterizing, optimizing, and producing materials for manufacturing optical devices.


Optical Characterization of Semiconductors

Optical Characterization of Semiconductors

Author: Sidney Perkowitz

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 229

ISBN-13: 0080984274

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories


Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author: Gerhard Huebschen

Publisher: Woodhead Publishing

Published: 2016-03-23

Total Pages: 322

ISBN-13: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials