Nuclear Radiation Effects Data on Large Scale Integrated Circuits
Author: Roland Polimadei
Publisher:
Published: 1980
Total Pages: 84
ISBN-13:
DOWNLOAD EBOOKThis summary tabulates nuclear radiation effects data on large scale integrated (LSI) circuits. It is intended to be a handy reference to help engineers select components for systems that must survive a given radiation level or evaluate the radiation hardness of previously designed systems. Most of the data in this report were compiled from papers presented at the Annual IEEE Conference on Nuclear and Space Radiation Effects (1971 through 1979). The remainder came from a variety of government and industry reports. Due to the complexity of testing procedures of LSI devices and the space constraints of a tabular format, not all pertinent data can be presented in this summary. We have attempted to give most of the data needed for assessing the hardness of a given component. The balance of the information can be found in the references.