Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
This book demonstrates the role and abilities of fluctuation in semiconductor physics, and shows what kinds of physical information are involved in the noise characteristics of semiconductor materials and devices, how this information may be decoded and which advantages are inherent to the noise methods. The text provides a comprehensive account of current results, addressing problems which have not previously been covered in Western literature, including the excess noise of tunnel-recombination currents and photocurrents in diodes, fluctuation phenomena in a real photoconductor with different recombination centers, and methods of noise spectroscopy of levels in a wide range of materials and devices.
Noise in physical systems - as a consequence of the corpuscular nature of matter - conveys information about microscopic mechanisms determining the macroscopic behavior of the system. Besides being a source of information, noise also represents a source of annoying disturbances which affect information transMission along a physical system. Therefore, noise analysis can promote our insight into the behavior of a physical system, as well as our knowledge of the natural constraints imposed upon physical-information transmission channels and devices. In recent years the continuous scientific and technical interest in noise problems has led to a remarkable progress in the understanding of noise phenomena. This progress is reflected by the rich material presented at the Fifth International Conference on Noise in Physical Systems. The conference papers originally published in these proceedings cover the various aspects of today's noise research in the fields of solid-state devices, l/f-noise, magnetic and superconducting materials, measuring methods, and theory of fluctuations. Each session of the conference was introduced by one or two invited review lectures which are included in these proceedings in full length. The 12 invited papers and more than 40 contributed papers on specific topics (only three of them have been omitted from the proceedings since they will be published elsewhere) provide a comprehensive survey of the current state-of-the-art and recent advances of noise analysis.
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Noise and Fluctuations Control in Electronic Devices is the first single reference source to bring together the latest aspects of noise research for a wide range of multidisciplinary audiences. The goal of this book is to give an update of state-of-the-art in this interdisciplinary field, while focusing on new trends in electronic device noise research. Such new trends include investigation of noise in electronic devices based on novel materials, effects of the downscaling on the device noise performance, fluctuations and noise control in nanodevices, effective methods of noise control and suppression, etc. In addition, the book presents a historic overview of the development of the kinetic theory of fluctuation, essential for understanding of the present state-of-the art. This book contains 18 state-of-the-art review chapters written by 33 internationally renowned experts from 15 countries. This book has about 1,500 bibliographical citations and hundreds of illustrations, figures, tables and equations. This book is a definite reference source for students, scientists, engineers, and specialists both in academia and industry working in such different fields as electronic and optoelectronic devices, electrical and electronic engineering, solid-state physics, nanotechnology, wireless communication, telecommunication, and semiconductor device technology.
The Third Edition of the standard textbook and reference in the field of semiconductor devices This classic book has set the standard for advanced study and reference in the semiconductor device field. Now completely updated and reorganized to reflect the tremendous advances in device concepts and performance, this Third Edition remains the most detailed and exhaustive single source of information on the most important semiconductor devices. It gives readers immediate access to detailed descriptions of the underlying physics and performance characteristics of all major bipolar, field-effect, microwave, photonic, and sensor devices. Designed for graduate textbook adoptions and reference needs, this new edition includes: A complete update of the latest developments New devices such as three-dimensional MOSFETs, MODFETs, resonant-tunneling diodes, semiconductor sensors, quantum-cascade lasers, single-electron transistors, real-space transfer devices, and more Materials completely reorganized Problem sets at the end of each chapter All figures reproduced at the highest quality Physics of Semiconductor Devices, Third Edition offers engineers, research scientists, faculty, and students a practical basis for understanding the most important devices in use today and for evaluating future device performance and limitations. A Solutions Manual is available from the editorial department.
Analog circuit design has grown in importance because so many circuits cannot be realized with digital techniques. Examples are receiver front-ends, particle detector circuits, etc. Actually, all circuits which require high precision, high speed and low power consumption need analog solutions. High precision also needs low noise. Much has been written already on low noise design and optimization for low noise. Very little is available however if the source is not resistive but capacitive or inductive as is the case with antennas or semiconductor detectors. This book provides design techniques for these types of optimization. This book is thus intended firstly for engineers on senior or graduate level who have already designed their first operational amplifiers and want to go further. It is especially for engineers who do not want just a circuit but the best circuit. Design techniques are given that lead to the best performance within a certain technology. Moreover, this is done for all important technologies such as bipolar, CMOS and BiCMOS. Secondly, this book is intended for engineers who want to understand what they are doing. The design techniques are intended to provide insight. In this way, the design techniques can easily be extended to other circuits as well. Also, the design techniques form a first step towards design automation. Thirdly, this book is intended for analog design engineers who want to become familiar with both bipolar and CMOS technologies and who want to learn more about which transistor to choose in BiCMOS.
This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086).