NEXAFS Spectroscopy

NEXAFS Spectroscopy

Author: Joachim Stöhr

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 415

ISBN-13: 3662028530

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This is the first ever comprehensive treatment of NEXAFS spectroscopy. It is suitable for novice researchers as an introduction to the field, while experts will welcome the detailed description of state-of-the-art instrumentation and analysis techniques, along with the latest experimental and theoretical results.


Fundamentals and Applications in Aerosol Spectroscopy

Fundamentals and Applications in Aerosol Spectroscopy

Author: Ruth Signorell

Publisher: CRC Press

Published: 2010-12-20

Total Pages: 513

ISBN-13: 142008562X

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Helping you better understand the processes, instruments, and methods of aerosol spectroscopy, Fundamentals and Applications in Aerosol Spectroscopy provides an overview of the state of the art in this rapidly developing field. It covers fundamental aspects of aerosol spectroscopy, applications to atmospherically and astronomically relevant problem


Handbook of Spectroscopy

Handbook of Spectroscopy

Author: G¿nter Gauglitz

Publisher: John Wiley & Sons

Published: 2014-05-05

Total Pages: 2011

ISBN-13: 3527654720

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This second, thoroughly revised, updated and enlarged edition provides a straightforward introduction to spectroscopy, showing what it can do and how it does it, together with a clear, integrated and objective account of the wealth of information that may be derived from spectra. It also features new chapters on spectroscopy in nano-dimensions, nano-optics, and polymer analysis. Clearly structured into sixteen sections, it covers everything from spectroscopy in nanodimensions to medicinal applications, spanning a wide range of the electromagnetic spectrum and the physical processes involved, from nuclear phenomena to molecular rotation processes. In addition, data tables provide a comparison of different methods in a standardized form, allowing readers to save valuable time in the decision process by avoiding wrong turns, and also help in selecting the instrumentation and performing the experiments. These four volumes are a must-have companion for daily use in every lab.


Computational Strategies for Spectroscopy

Computational Strategies for Spectroscopy

Author: Vincenzo Barone

Publisher: John Wiley & Sons

Published: 2011-11-22

Total Pages: 608

ISBN-13: 0470470178

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Computational spectroscopy is a rapidly evolving field that is becoming a versatile and widespread tool for the assignment of experimental spectra and their interpretation as related to chemical physical effects. This book is devoted to the most significant methodological contributions in the field, and to the computation of IR, UV-VIS, NMR and EPR spectral parameters with reference to the underlying vibronic and environmental effects. Each section starts with a chapter written by an experimental spectroscopist dealing with present challenges in the different fields; comprehensive coverage of conventional and advanced spectroscopic techniques is provided by means of dedicated chapters written by experts. Computational chemists, analytical chemists and spectroscopists, physicists, materials scientists, and graduate students will benefit from this thorough resource.


Characterization and Analysis of Polymers

Characterization and Analysis of Polymers

Author: Wiley

Publisher: John Wiley & Sons

Published: 2008-02-08

Total Pages: 987

ISBN-13: 0470233001

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Based on Wiley's renowned Encyclopedia of Polymer Science and Technology, this book provides coverage of key methods of characterization of the physical and chemical properties of polymers, including atomic force microscopy, chromatographic methods, laser light scattering, nuclear magnetic resonance, and thermal analysis, among others. Written by prominent scholars from around the world, this reference presents over twenty-five self -contained articles on the most used analytical techniques currently practiced in polymer science.


X-ray and Neutron Techniques for Nanomaterials Characterization

X-ray and Neutron Techniques for Nanomaterials Characterization

Author: Challa S.S.R. Kumar

Publisher: Springer

Published: 2016-10-13

Total Pages: 835

ISBN-13: 3662486067

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Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Surface Science Techniques

Surface Science Techniques

Author: Gianangelo Bracco

Publisher: Springer Science & Business Media

Published: 2013-01-11

Total Pages: 668

ISBN-13: 3642342434

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The book describes the experimental techniques employed to study surfaces and interfaces. The emphasis is on the experimental method. Therefore all chapters start with an introduction of the scientific problem, the theory necessary to understand how the technique works and how to understand the results. Descriptions of real experimental setups, experimental results at different systems are given to show both the strength and the limits of the technique. In a final part the new developments and possible extensions of the techniques are presented. The included techniques provide microscopic as well as macroscopic information. They cover most of the techniques used in surface science.


Spectroscopy for Materials Characterization

Spectroscopy for Materials Characterization

Author: Simonpietro Agnello

Publisher: John Wiley & Sons

Published: 2021-09-08

Total Pages: 500

ISBN-13: 1119697328

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SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.


X-Ray Absorption Spectroscopy of Semiconductors

X-Ray Absorption Spectroscopy of Semiconductors

Author: Claudia S. Schnohr

Publisher: Springer

Published: 2014-11-05

Total Pages: 367

ISBN-13: 3662443627

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.