Neutron Yields from Proton Bombardment of Thick Targets
Author: Thomas Marshall Amos (Jr.)
Publisher:
Published: 1972
Total Pages: 322
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author: Thomas Marshall Amos (Jr.)
Publisher:
Published: 1972
Total Pages: 322
ISBN-13:
DOWNLOAD EBOOKAuthor: George Patrick Millburn
Publisher:
Published: 1956
Total Pages: 112
ISBN-13:
DOWNLOAD EBOOKAuthor: Hoyt Alan Bostick
Publisher:
Published: 1959
Total Pages: 106
ISBN-13:
DOWNLOAD EBOOKAuthor: G Dutto
Publisher: World Scientific
Published: 1993-01-08
Total Pages: 980
ISBN-13: 9814554200
DOWNLOAD EBOOKThis volume describes the latest developments in the design, construction and operation of cyclotrons, from compact machines producing intense beams for isotope production, cancer therapy and industrial use, to the larger versions giving higher energy beams of ions of various elements for nuclear and particle physics. Important topics include ECR ion sources, superconducting magnets and radiofrequency cavities, beam dynamics and diagnostics, beam cooling rings, control systems and various medical and industrial applications.
Author:
Publisher:
Published: 1976-05
Total Pages: 912
ISBN-13:
DOWNLOAD EBOOKAuthor: H. T. Richards
Publisher:
Published: 1950
Total Pages: 16
ISBN-13:
DOWNLOAD EBOOKAuthor: Joseph L. Fowler
Publisher:
Published: 1980
Total Pages: 1062
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1987
Total Pages: 484
ISBN-13:
DOWNLOAD EBOOKAuthor: B. W. Sargent
Publisher:
Published: 1946
Total Pages: 8
ISBN-13:
DOWNLOAD EBOOKAuthor: Takashi Nakamura
Publisher: World Scientific
Published: 2008
Total Pages: 364
ISBN-13: 9812778810
DOWNLOAD EBOOKTerrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.