National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
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Published: 1999
Total Pages: 148
ISBN-13:
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Published: 1999
Total Pages: 148
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DOWNLOAD EBOOKAuthor: National Semiconductor Metrology Program (U.S.)
Publisher:
Published: 1999
Total Pages: 148
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DOWNLOAD EBOOKAuthor: National Institute of Standards and Technology (U.S.)
Publisher:
Published: 1999
Total Pages: 148
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DOWNLOAD EBOOKAuthor:
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Published: 2000
Total Pages: 160
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DOWNLOAD EBOOKAuthor: National Institute of Standards and Technology (U.S.)
Publisher:
Published: 1994
Total Pages: 1162
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DOWNLOAD EBOOKAuthor: D. K. Harman
Publisher: DIANE Publishing
Published: 1995-10
Total Pages: 527
ISBN-13: 0788125214
DOWNLOAD EBOOKHeld in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Author: James R. Ehrstein
Publisher:
Published: 1974
Total Pages: 300
ISBN-13:
DOWNLOAD EBOOKAuthor: Barry N. Taylor
Publisher: DIANE Publishing
Published: 2009-11
Total Pages: 25
ISBN-13: 1437915566
DOWNLOAD EBOOKResults of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Author: Mary Jo DiBernardo
Publisher:
Published: 2002
Total Pages: 0
ISBN-13:
DOWNLOAD EBOOKAuthor: National Institute of Standards and Technology (U.S.)
Publisher:
Published: 1995
Total Pages: 146
ISBN-13:
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