Nanoscale Calibration Standards and Methods
Nanoscale Calibration Standards and Methods

Author: Günter Wilkening

Publisher: John Wiley & Sons

Published: 2006-05-12

Total Pages: 541

ISBN-13: 3527606874

DOWNLOAD EBOOK

The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Quantitative Data Processing in Scanning Probe Microscopy
Quantitative Data Processing in Scanning Probe Microscopy

Author: Petr Klapetek

Publisher: Elsevier

Published: 2018-02-03

Total Pages: 418

ISBN-13: 0128133481

DOWNLOAD EBOOK

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ - Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques - Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy - Worked examples show quantitative data processing for different SPM analytical techniques

The Nano-Micro Interface
The Nano-Micro Interface

Author: Hans-Jörg Fecht

Publisher: John Wiley & Sons

Published: 2006-03-06

Total Pages: 351

ISBN-13: 3527604332

DOWNLOAD EBOOK

Two exciting worlds of science and technology - the nano and micro dimensions. The former is a booming new field of research, the latter the established size range for electronics, and for mutual technological benefit and future commercialization, suitable junctions need to be found. Functional nanostructures such as DNA computers, sensors, neural interfaces, nanooptics or molecular electronics need to be wired to their 'bigger' surroundings. Coming from the opposite direction, microelectronics have experienced an unprecedented miniaturization drive in the last decade, pushing ever further down through the micro size scale towards submicron circuitry. Bringing these two worlds together is a new interdisciplinary challenge for scientists and engineers alike - recognized and substantially funded by the European Commission and other major project initiators worldwide. This book offers a wide range of information from technologies to materials and devices as well as from research to administrative know-how collected by the editors from renowned key members of the nano/micro community.

Handbook of Surface and Nanometrology
Handbook of Surface and Nanometrology

Author: David J. Whitehouse

Publisher: CRC Press

Published: 2002-12-01

Total Pages: 982

ISBN-13: 1420034197

DOWNLOAD EBOOK

The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained wit

Nanotechnology Standards
Nanotechnology Standards

Author: Vladimir Murashov

Publisher: Springer Science & Business Media

Published: 2011-02-01

Total Pages: 269

ISBN-13: 1441978534

DOWNLOAD EBOOK

Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting
Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting

Author: Alexei Nazarov

Publisher: Springer

Published: 2014-08-28

Total Pages: 464

ISBN-13: 3319088041

DOWNLOAD EBOOK

This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between “More Moore” and “More than Moore” are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.

Scanning Probe Microscopy of Soft Matter
Scanning Probe Microscopy of Soft Matter

Author: Vladimir V. Tsukruk

Publisher: John Wiley & Sons

Published: 2012-01-09

Total Pages: 663

ISBN-13: 3527639969

DOWNLOAD EBOOK

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors

Plasma Nanoscience
Plasma Nanoscience

Author: Kostya Ostrikov

Publisher: John Wiley & Sons

Published: 2008-09-22

Total Pages: 572

ISBN-13: 9783527407408

DOWNLOAD EBOOK

Filling the need for a single work specifically addressing how to use plasma for the fabrication of nanoscale structures, this book is the first to cover plasma deposition in sufficient depth. The author has worked with numerous R&D institutions around the world, and here he begins with an introductory overview of plasma processing at micro- and nanoscales, as well as the current problems and challenges, before going on to address surface preparation, generation and diagnostics, transport and the manipulation of nano units.

Fundamental Principles of Engineering Nanometrology
Fundamental Principles of Engineering Nanometrology

Author: Richard Leach

Publisher: Elsevier

Published: 2014-05-17

Total Pages: 384

ISBN-13: 1455777501

DOWNLOAD EBOOK

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations

Automation 2017
Automation 2017

Author: Roman Szewczyk

Publisher: Springer

Published: 2017-02-28

Total Pages: 614

ISBN-13: 3319540424

DOWNLOAD EBOOK

This book consists of papers presented at Automation 2017, an international conference held in Warsaw from March 15 to 17, 2017. It discusses research findings associated with the concepts behind INDUSTRY 4.0, with a focus on offering a better understanding of and promoting participation in the Fourth Industrial Revolution. Each chapter presents a detailed analysis of a specific technical problem, in most cases followed by a numerical analysis, simulation and description of the results of implementing the solution in a real-world context. The theoretical results, practical solutions and guidelines presented are valuable for both researchers working in the area of engineering sciences and practitioners looking for solutions to industrial problems.