"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
This volume provides a comprehensive introduction and explanation of both the theory and practice of all forms of modern antenna measurements, electromagnetic theory, antenna coupling, compact range measurements, near-field antenna measurements, mobile and body-centric antenna measurements.
Metrology, the science of measurement, is crucial for many sciences and technological developments. Since metrology helps to improve many other sciences, the book reflects in general metrology and some special metrological approaches at different fields such as radiation and frequency measurements in detail. This book also focuses on technical testing and control applications in the industry. It also intends the fundamentals of metrology concerning the related standards and systems of units. In addition, the book considers the calibration of measurement instruments and measurement uncertainties as the basic requirements of the related quality standards.
Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.
Physical Methods, Instruments and Measurements theme is a component of the Encyclopedia of Physical Sciences, Engineering and Technology Resources which is part of the global Encyclopedia of Life Support Systems (EOLSS), an integrated compendium of twenty Encyclopedias. The Theme provides a complete survey of the present status of our knowledge of modern physical instruments and measurements. It is organized in the following main topics: Measurements and Measurement Standards; Sources of Particles and Radiation, Detectors and Sensors; Imaging and Characterizing – Trace Element Analysis; Technology of Physical Experiments; Applications of Measurements and Instrumentation which are then expanded into multiple subtopics, each as a chapter. These four volumes are aimed at the following five major target audiences: University and College Students, Educators, Professional Practitioners, Research Personnel and Policy Analysts, Managers, and Decision Makers and NGOs
Since the beginning of the preparation of this volume, we have been convinced that temperature and pressure measurements should not be separated, particularly in different applications at low temperatures. This belief has made us deeply conscious of the fact that the advanced applications and modern experimental methods of investigation in science and technology need the combination of various professional experiences and approaches. Although the book is divided into two parts (Part I by F. Pavese and Part II by G. F. Molinar), we have tried to correlate low-temperature and low-pressure measurements as much as possible. We hope that our readers will find this book, which contains a large number of experimental and reference data, useful in their effort to solve measurement problems. We are pleased to acknowledge our debt to several persons and wish to express our gratitude to them for their valuable cooperation and help: to our research group colleagues at the Istituto di Metrologia "G. Colonnetti" -IMGC (CNR), without whom the knowledge and the experience we built up during many years could not have been acquired; to G. T. McConville, M. Durieux, and K. Grohmann for revisions of and various suggestions for Part I; to V. E. Bean and C. R. Tilford of NIST and G. T. McConville for revisions of and various suggestions for Part II; and to I. Prinetti of IMGC for many valuable suggestions and careful textual revisions.
