An Introduction to Microscopy by Means of Light, Electrons, X-Rays, or Ultrasound
An Introduction to Microscopy by Means of Light, Electrons, X-Rays, or Ultrasound

Author: Eugene Rochow

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 379

ISBN-13: 1468424548

DOWNLOAD EBOOK

Many people look upon a microscope as a mere instrument(l); to them microscopy is instrumentation. Other people consider a microscope to be simply an aid to the eye; to them microscopy is primarily an expan sion of macroscopy. In actuality, microscopy is both objective and sub jective; it is seeing through an instrument by means of the eye, and more importantly, the brain. The function of the brain is to interpret the eye's image in terms of the object's structure. Thought and experience are required to distinguish structure from artifact. It is said that Galileo (1564-1642) had his associates first look through his telescope microscope at very familiar objects to convince them that the image was a true representation of the object. Then he would have them proceed to hitherto unknown worlds too far or too small to be seen with the un aided eye. Since Galileo's time, light microscopes have been improved so much that performance is now very close to theoretical limits. Electron microscopes have been developed in the last four decades to exhibit thousands of times the resolving power of the light microscope. Through the news media everyone is made aware of the marvelous microscopical accomplishments in imagery. However, little or no hint is given as to what parts of the image are derived from the specimen itself and what parts are from the instrumentation, to say nothing of the changes made during preparation of the specimen.

Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics
Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics

Author: Theodore G. Rochow

Publisher: Springer Science & Business Media

Published: 2013-06-29

Total Pages: 462

ISBN-13: 1489915133

DOWNLOAD EBOOK

Following three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up to date. In doing so the authors aim to show how the newer microscopies are related to the older types with respect to theoretical resolving power (what you pay for) and resolution (what you get). The book is an introduction to students, technicians, technologists, and scientists in biology, medicine, science, and engineering. It should be useful in academic and industrial research, consulting, and forensics; how ever, the book is not intended to be encyclopedic. The authors are greatly indebted to the College of Textiles of North Carolina State University at Raleigh for support from the administration there for typing, word processing, stationery, mailing, drafting diagrams, and general assistance. We personally thank Joann Fish for word process ing, Teresa M. Langley and Grace Parnell for typing services, Mark Bowen for drawing graphs and diagrams, Chuck Gardner for photographic ser vices, Deepak Bhattavahalli for his work with the proofs, and all the other people who have given us their assistance. The authors wish to acknowledge the many valuable suggestions given by Eugene G. Rochow and the significant editorial contributions made by Elizabeth Cook Rochow.

Bioimaging
Bioimaging

Author: Douglas E. Chandler

Publisher: Jones & Bartlett Publishers

Published: 2009

Total Pages: 468

ISBN-13: 0763738743

DOWNLOAD EBOOK

The Development Of Microscopy Revolutionized The World Of Cell And Molecular Biology As We Once Knew It And Will Continue To Play An Important Role In Future Discoveries. Bioimaging: Current Concepts In Light And Electron Microscopy Is The Optimal Text For Any Undergraduate Or Graduate Bioimaging Course, And Will Serve As An Important Reference Tool For The Research Scientist. This Unique Text Covers, In Great Depth, Both Light And Electron Microscopy, As Well As Other Structure And Imaging Techniques Like X-Ray Crystallography And Atomic Force Microscopy. Written In A User-Friendly Style And Covering A Broad Range Of Topics, Bioimaging Describes The State-Of-The-Art Technologies That Have Powered The Field To The Forefront Of Cellular And Molecular Biological Research.

Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis

Author: Joseph Goldstein

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 679

ISBN-13: 1461332737

DOWNLOAD EBOOK

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Light and Electron Microscopy
Light and Electron Microscopy

Author: Elizabeth M. Slayter

Publisher: Cambridge University Press

Published: 1992-10-30

Total Pages: 336

ISBN-13: 9780521339483

DOWNLOAD EBOOK

The compound optical microscope, in its various modern forms, is probably the most familiar of all laboratory instruments and the electron microscope, once an exotic rarity, has now become a standard tool in biological and materials research. Both instruments are often used effectively with little knowledge of the relevant theory, or even of how a particular type of microscope functions. Eventually however, proper use, interpretation of images and choices of specific applications demand an understanding of fundamental principles. This book describes the principles of operation of each type of microscope currently available and of use to biomedical and materials scientists. It explains the mechanisms of image formation, contrast and its enhancement, accounts for ultimate limits on the size of observable details (resolving power and resolution) and finally provides an account of Fourier optical theory. Principles behind the photographic methods used in microscopy are also described and there is some discussion of image processing methods. The book will appeal to graduate students and researchers in the biomedical sciences, and it will be helpful to students taking a course involving the principles of microscopy.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Author: Patrick Echlin

Publisher: Springer Science & Business Media

Published: 2011-04-14

Total Pages: 329

ISBN-13: 0387857311

DOWNLOAD EBOOK

Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

X-Ray Microscopy
X-Ray Microscopy

Author: V. E. Cosslett

Publisher: Cambridge University Press

Published: 2014-06-12

Total Pages: 455

ISBN-13: 1107654653

DOWNLOAD EBOOK

Originally published in 1960, this book looks at the physical principles behind the use of X-rays for microscopic investigation. Cosslett and Nixon review a variety of techniques used in X-ray microscopy, as well as specimen preparation methods. Many plates of various X-rayed materials are also included.

Scanning Electron Microscopy and X-ray Microanalysis
Scanning Electron Microscopy and X-ray Microanalysis

Author: Robert Edward Lee

Publisher: Prentice Hall

Published: 1993

Total Pages: 488

ISBN-13:

DOWNLOAD EBOOK

A description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, vacuum generation, and energy and wavelength dispersive X-ray spectroscopy.