Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

Author: A.G. Cullis

Publisher: CRC Press

Published: 2020-11-25

Total Pages: 552

ISBN-13: 1000156974

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This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

Author: A.G. Cullis

Publisher: CRC Press

Published: 2020-11-25

Total Pages: 533

ISBN-13: 1000112160

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This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference Held at Oxford University, 20-23 March 1995
Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference Held at Oxford University, 20-23 March 1995

Author: A. G. Cullis

Publisher: CRC Press

Published: 1995

Total Pages: 824

ISBN-13:

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This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.

Bibliographic Guide to Conference Publications
Bibliographic Guide to Conference Publications

Author: New York Public Library. Research Libraries

Publisher:

Published: 1986

Total Pages: 618

ISBN-13:

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Vols. for 1975- include publications cataloged by the Research Libraries of the New York Public Library with additional entries from the Library of Congress MARC tapes.