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Publisher: ASM International
Published: 2002-01-01
Total Pages: 160
ISBN-13: 0871707691
DOWNLOAD EBOOKProvides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Author: Tejinder Gandhi
Publisher: ASM International
Published: 2019-11-01
Total Pages: 719
ISBN-13: 1627082468
DOWNLOAD EBOOKThe Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author: EDFAS Desk Reference Committee
Publisher: ASM International
Published: 2011
Total Pages: 673
ISBN-13: 1615037268
DOWNLOAD EBOOKIncludes bibliographical references and index.
Author:
Publisher: ASM International
Published: 2004-01-01
Total Pages: 813
ISBN-13: 0871708043
DOWNLOAD EBOOKFor newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Author: Shahrzad Salemi
Publisher: RIAC
Published: 2008
Total Pages: 271
ISBN-13: 1933904291
DOWNLOAD EBOOKAuthor: Perry L. Martin
Publisher: McGraw Hill Professional
Published: 1999
Total Pages: 770
ISBN-13: 9780070410442
DOWNLOAD EBOOKAnnotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--BOOK JACKET. Title Summary field provided by Blackwell North America, Inc. All Rights Reserved.
Author:
Publisher: ASM International
Published: 2001-01-01
Total Pages: 162
ISBN-13: 0871707454
DOWNLOAD EBOOKDeveloped by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author: Milton Ohring
Publisher: Academic Press
Published: 2014-10-14
Total Pages: 759
ISBN-13: 0080575528
DOWNLOAD EBOOKReliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: C.R.M. Grovenor
Publisher: CRC Press
Published: 1989-01-01
Total Pages: 560
ISBN-13: 9780852742709
DOWNLOAD EBOOKThis practical book shows how an understanding of structure, thermodynamics, and electrical properties can explain some of the choices of materials used in microelectronics, and can assist in the design of new materials for specific applications. It emphasizes the importance of the phase chemistry of semiconductor and metal systems for ensuring the long-term stability of new devices. The book discusses single-crystal and polycrystalline silicon, aluminium- and gold-based metallisation schemes, packaging semiconductor devices, failure analysis, and the suitability of various materials for optoelectronic devices and solar cells. It has been designed for senior undergraduates, graduates, and researchers in physics, electronic engineering, and materials science.
Author: Yan Li
Publisher: Springer Nature
Published: 2020-11-23
Total Pages: 629
ISBN-13: 9811570906
DOWNLOAD EBOOKThis book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development.
