Microelectronic Device Data Handbook: Text. -v. 2. Manufacturer and specific device information
Author: ARINC Research Corporation, Annapolis, Md
Publisher:
Published: 1968
Total Pages: 316
ISBN-13:
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Author: ARINC Research Corporation, Annapolis, Md
Publisher:
Published: 1968
Total Pages: 316
ISBN-13:
DOWNLOAD EBOOKAuthor: United States. National Aeronautics and Space Administration Scientific and Technical Information Division
Publisher:
Published: 1968
Total Pages: 478
ISBN-13:
DOWNLOAD EBOOKAuthor: United States. National Aeronautics and Space Administration. Scientific and Technical Information Division
Publisher:
Published: 1969
Total Pages: 470
ISBN-13:
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Publisher:
Published: 1993
Total Pages: 480
ISBN-13:
DOWNLOAD EBOOKAuthor: Engineering Societies Library
Publisher:
Published: 1969
Total Pages: 550
ISBN-13:
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Publisher:
Published: 1975
Total Pages: 2834
ISBN-13:
DOWNLOAD EBOOKAuthor: United States. Superintendent of Documents
Publisher:
Published: 1966
Total Pages: 1320
ISBN-13:
DOWNLOAD EBOOKAuthor: Abraham Landzberg
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 663
ISBN-13: 1461520290
DOWNLOAD EBOOKThe world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Author: United States. Superintendent of Documents
Publisher:
Published: 1970
Total Pages: 1348
ISBN-13:
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