Microelectronics Monitor
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Publisher:
Published: 1995
Total Pages: 216
ISBN-13:
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Author:
Publisher:
Published: 1995
Total Pages: 216
ISBN-13:
DOWNLOAD EBOOKAuthor: V. V. S. S. S. Chakravarthy
Publisher: Springer Nature
Published: 2022-04-22
Total Pages: 544
ISBN-13: 9811685509
DOWNLOAD EBOOKThis book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It contains original research works presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2021), held in Bhubaneswar, Odisha, India during 27 – 28 August 2021. The papers were written by scientists, research scholars and practitioners from leading universities, engineering colleges and R&D institutes from all over the world and share the latest breakthroughs in and promising solutions to the most important issues facing today’s society.
Author: Abraham Landzberg
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 663
ISBN-13: 1461520290
DOWNLOAD EBOOKThe world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Author: Kenichi Takahata
Publisher: BoD – Books on Demand
Published: 2009-12-01
Total Pages: 528
ISBN-13: 9533070277
DOWNLOAD EBOOKThis book discusses key aspects of MEMS technology areas, organized in twenty-seven chapters that present the latest research developments in micro electronic and mechanical systems. The book addresses a wide range of fundamental and practical issues related to MEMS, advanced metal-oxide-semiconductor (MOS) and complementary MOS (CMOS) devices, SoC technology, integrated circuit testing and verification, and other important topics in the field. ?Several chapters cover state-of-the-art microfabrication techniques and materials as enabling technologies for the microsystems. Reliability issues concerning both electronic and mechanical aspects of these devices and systems are also addressed in various chapters.
Author: W.F. Rush
Publisher: Taylor & Francis
Published: 2004-01-14
Total Pages: 337
ISBN-13: 1135383480
DOWNLOAD EBOOKAuthor: J. R. Bessant
Publisher: International Labour Organization
Published: 1989
Total Pages: 130
ISBN-13:
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Publisher:
Published: 1991
Total Pages: 608
ISBN-13:
DOWNLOAD EBOOKAuthor: Research Triangle Institute. Solid State Laboratory
Publisher:
Published: 1965
Total Pages: 148
ISBN-13:
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Publisher: ASM International
Published: 2004-01-01
Total Pages: 813
ISBN-13: 0871708043
DOWNLOAD EBOOKFor newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron