Materials Research Society Symposia Proceedings. Volume 35. Energy Beam-Solid Interactions and Transient Thermal Processing Held on November 26-30, 1984 at Boston, Massachusetts

Materials Research Society Symposia Proceedings. Volume 35. Energy Beam-Solid Interactions and Transient Thermal Processing Held on November 26-30, 1984 at Boston, Massachusetts

Author: D. K. Biegelsen

Publisher:

Published: 1985

Total Pages: 761

ISBN-13:

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The symposium was devoted to those topical areas evolving from the subject of laser annealing. The material covered in this symposium has three distinct foci. First is the field of sub-microsecond (to femptosecond) interactions of energy beams with solids and the resultant material changes on similar time scales. Issues of energy transfer, internal equilibration, solid phase regrowth of amorphized layers, ultrarapid quenching of amorphous semiconductors dominate this topic. A second focus is the maturing area of rapid thermal processing (.001 to 100 seconds). The materials science issues of defect and impurity kinetics, and silicide and alloy development underlie a strong technological thrust. The third focus is the area of semiconductor growth over insulators by lateral epitaxy. Studies concerning low angle grain boundaries, the characteristic microscopic defects in zone melting recrystallization of thin films, and increasing emphasis on solid phase lateral epitaxy are showing strong progress towards technologically suitable preparation techniques.


Materials Research Society Symposia Proceedings. Volume 23. Energy Beam-Solid Interactions and Transient Thermal Processing Held at Boston, Massachusetts on 14-17 November 1983

Materials Research Society Symposia Proceedings. Volume 23. Energy Beam-Solid Interactions and Transient Thermal Processing Held at Boston, Massachusetts on 14-17 November 1983

Author: J. C. C. Fan

Publisher:

Published: 1984

Total Pages: 802

ISBN-13:

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Major Topics include: SOI(Silicon On Insulators); Technologies for Integrated Circuits; Fundamentals of Energy Beam Interactions with Solids; Applications of Energy Beams in Material and Device Processing; Device Applications of Rapid Thermal Processing; Fundamental Mechanisms; Transient Thermal Processing of Silicon; Defect Mechanisms and Crystallization of Semiconductor on Insulators; SOI Materials and Devices; Compound Semiconductors; and Metallic Alloys.


Fundamentals of Beam-Solid Interactions and Transient Thermal Processing Symposium Held in Boston, Massachusetts on November 30-December 30 1987. Volume 100. Materials Research Society Symposium Proceedings

Fundamentals of Beam-Solid Interactions and Transient Thermal Processing Symposium Held in Boston, Massachusetts on November 30-December 30 1987. Volume 100. Materials Research Society Symposium Proceedings

Author: Michael J. Aziz

Publisher:

Published: 1988

Total Pages: 764

ISBN-13:

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The material covered in this symposium focused on two distinct areas. The first was phase transformations induced by ion or electron bombardment, including amorphization and interface motion. The second was the behavior of solids during various forms of annealing and quenching ranging in duration from femtoseconds to hours, such as rapid solidification following pulsed laser melting and rapid thermal annealing. The overlap between these two areas consisted of topics such as motion of the crystal/amorphous interface during ion bombardment at elevated temperatures. The symposium revealed how these fields have matured over the last decade, and highlighted many new and several older, yet-unanswered questions that might be addressed in future research. Keywords: Phase transformations; Ion bombardment; Electron bombardment; Annealing; Quenching; Solidification; Interfaces.