Emphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn how to analyse for the light elements (boron, carbon, nitrogen, oxygen, and fluorine). Each technique is first described as it is used for qualitative analysis, and then quantitative analysis is developed. In a final chapter, the two techniques are compared. The book is a practical guide for biologists and for researchers in the medical, physical, and materials sciences.
Plants, fungi, and viruses were among the first biological objects studied with an electron microscope. One of the two first instruments built by Siemens was used by Helmut Ruska, a brother of Ernst Ruska, the pioneer in constructing electron microscopes. H. Ruska published numerous papers on different biological objects in 1939. In one of these, the pictures by G. A. Kausche, E. Pfankuch, and H. Ruska of tobacco mosaic virus opened a new age in microscopy. The main problem was then as it still is today, to obtain an appropriate preparation of the specimen for observation in the electron microscope. Beam damage and specimen thickness were the first obstacles to be met. L. Marton in Brussels not only built his own instrument, but also made considerable progress in specimen preparation by introducing the impregnation of samples with heavy metals to obtain useful contrast. His pictures of the bird nest orchid root impregnated with osmium were revolutionary when published in 1934. It is not the place here to recall the different techniques which were developed in the subsequent years to attain the modern knowledge on the fine structure of plant cells and of different plant pathogens. The tremendous progress obtained with tobacco mosaic virus is reflected in the chapter by M. Wurtz on the fine structure of viruses in this Volume. New cytochemical and immunological techniques considerably surpass the morphological information obtained from the pathogens, especially at the host-parasite interface.
The idea for putting together a tutorial on zeolites came originally from my co-editor, Eric Derouane, about 5 years ago. I ?rst met Eric in the mid-1980s when he spent 2 years working for Mobil R&D at our then Corporate lab at Princeton, NJ. He was on the senior technical staff with projects in the synthesis and characterization of new materials. At that time, I managed a group at our Paulsboro lab that was responsible for catalyst characterization in support of our catalyst and process development efforts, and also had a substantial group working on new material synthesis. Hence, our interests overlapped considerably and we met regularly. After Eric moved back to Namur (initially), we maintained contact, and in the 1990s, we met a number of times in Europe on projects of joint interest. It was after I retired from ExxonMobil in 2002 that we began to discuss the tutorial concept seriously. Eric had (semi-)retired and lived on the Algarve, the southern coast of Portugal. In January 2003, my wife and I spent 3 weeks outside of Lagos, and I worked parts of most days with Eric on the proposed content of the book. We decided on a comprehensive approach that ultimately amounted to some 20+ chapters covering all of zeolite chemistry and catalysis and gave it the title Zeolite Chemistry and Catalysis: An integrated Approach and Tutorial.
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
This volume of conference proceedings characterizes the microstructure of materials ranging from polymers to superconductors. Electron energy loss spectrometry is a recent addition to the group of diffraction, imaging and spectroscopic techniques available for the study of materials by transmission electron microscope. The book is intended for the use of materials scientists who are looking for a combination of analytical tools and problem-solving approaches.
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
This text deals with the effect of processing on the microstructure and properties of advanced structural and electroceramic materials. It fulfils the need for a well illustrated book explaining the relation between microstructure and properties in structural ceramics, featuring high quality micrographs and characterization techniques.
Bone is a complex biological material that consists of both an inorganic and organic phase, which undergoes continuous dynamic biological processes within the body. This complex structure and the need to acquire accurate data have resulted in a wide variety of methods applied in the physical analysis of bone in vivo and in vitro. Each method has it
