This proceedings contains 9 lectures given by active research scientists, introducing the latest developments in the field of surface physics. The main topics cover both experimental and theoretical aspects of the atomic and electronic structure of semiconductor surface, its characterization by direct and inverse photoemission and STM, chemisorption and bonding on semiconductor, growth of III-V compound semiconductor and metal surface, metal-semiconductor interface and metal silicides.
This volume contains the proceedings of the 8th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily. The book assesses the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures. The contributions consider the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is placed on the theory of non-linear optics and on dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of Scanning Near-field Optical Microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also included.
The book is aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and assessing the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of nonlinear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of Scanning Probe Microscopy to Material Science and biological samples, dried and in vivo, with the use of different laser sources are also presented. Materials of particular interest are silicon, semiconductor-metal interfaces, semiconductor and magnetic multi-layers and III-V compound semiconductors.
This special volume contains the proceedings of the 9th Epioptics Workshop, held at the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 20 to 26, 2006. The workshop was the 9th in the Epioptics series and the 39th of the International School of Solid State Physics.The workshop was aimed at assessing the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and at assessing the usefulness of these techniques for optimization of high-quality multilayer samples through feedback control during materials growth and processing. Particular emphasis is dedicated to the theory of non-linear optics and to dynamical processes through the use of pump-probe techniques together with the search for new optical sources. Some new applications of scanning probe microscopy to material science and biological samples, dried and in vivo, with the use of different laser sources are also presented.
This book assesses the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures. It also examines the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Emphasis is given to dynamical processes through the use of pump-probe techniques, together with the search for new optical sources. Some new applications of scanning probe microscopy to materials science and biological samples (dried and in vivo) with the use of different laser sources are also presented.
In recent decades surface science has experienced a large growth in connection with the development of various experimental techniques which are able to characterize solid surfaces through the observation of the scattering of ions, electrons, photons or atoms. These methods of investigation, known under different labels such as LEED, AES, XPS, UPS, etc. have been extensively applied in describing the structure, morphology, and chemical and physical properties of crystal surfaces and interfaces of a large variety of materials of interest in solid-state physics, electronics, metallurgy, biophysics, and heterogeneous catalysis. Among these methods we wish to emphasize molecular beam scattering from solid surfaces. ~lolecular beam scattering has gone through a large development in the last ten years. In this decade a large number of laboratories have used this method to study various clean and adsorbate-covered surfaces. The technique is nonetheless quite old. It dates back to the beginning of the thirties, when Estermann and Stern performed the first atom diffraction experiment proving the wave nature of atoms. In the following years the entire subject of gas-surface interaction was considered a branch of rarefied gas dynamics and developed in connection with aerospace research. Attention was then given to the integral properties of gas-solid interactions (sticking and energy accomodation, mean momentum transfer) rather than to atom-surface scatter ing from well-characterized surfaces.
