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Author: ASM International
Publisher: ASM International
Published: 2017-12-01
Total Pages: 666
ISBN-13: 1627081518
DOWNLOAD EBOOKThe theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
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Publisher: ASM International
Published: 2019-12-01
Total Pages: 540
ISBN-13: 1627082735
DOWNLOAD EBOOKThe theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
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Publisher: ASM International
Published: 2018-12-01
Total Pages:
ISBN-13: 1627080996
DOWNLOAD EBOOKThe International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author: Tejinder Gandhi
Publisher: ASM International
Published: 2019-11-01
Total Pages: 750
ISBN-13: 1627082468
DOWNLOAD EBOOKThe Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author: Navid Asadizanjani
Publisher: Springer Nature
Published: 2021-02-15
Total Pages: 193
ISBN-13: 3030626091
DOWNLOAD EBOOKThis book provides readers with a comprehensive introduction to physical inspection-based approaches for electronics security. The authors explain the principles of physical inspection techniques including invasive, non-invasive and semi-invasive approaches and how they can be used for hardware assurance, from IC to PCB level. Coverage includes a wide variety of topics, from failure analysis and imaging, to testing, machine learning and automation, reverse engineering and attacks, and countermeasures.
Author: Mark Tehranipoor
Publisher: Springer Nature
Published:
Total Pages: 538
ISBN-13: 3031586875
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 2017
Total Pages: 645
ISBN-13: 9781523127856
DOWNLOAD EBOOKAuthor: Yan Li
Publisher: Springer Nature
Published: 2020-11-23
Total Pages: 629
ISBN-13: 9811570906
DOWNLOAD EBOOKThis book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development.
Author: Farimah Farahmandi
Publisher: Springer Nature
Published: 2023-05-11
Total Pages: 415
ISBN-13: 3031268962
DOWNLOAD EBOOKThis book provides an overview of current hardware security problems and highlights how these issues can be efficiently addressed using computer-aided design (CAD) tools. Authors are from CAD developers, IP developers, SOC designers as well as SoC verification experts. Readers will gain a comprehensive understanding of SoC security vulnerabilities and how to overcome them, through an efficient combination of proactive countermeasures and a wide variety of CAD solutions.
Author: Mark Tehranipoor
Publisher: Springer Nature
Published: 2022-12-15
Total Pages: 356
ISBN-13: 3031191854
DOWNLOAD EBOOKThis book provides an overview of current hardware security primitives, their design considerations, and applications. The authors provide a comprehensive introduction to a broad spectrum (digital and analog) of hardware security primitives and their applications for securing modern devices. Readers will be enabled to understand the various methods for exploiting intrinsic manufacturing and temporal variations in silicon devices to create strong security primitives and solutions. This book will benefit SoC designers and researchers in designing secure, reliable, and trustworthy hardware. Provides guidance and security engineers for protecting their hardware designs; Covers a variety digital and analog hardware security primitives and applications for securing modern devices; Helps readers understand PUF, TRNGs, silicon odometer, and cryptographic hardware design for system security.
