ISTFA 2010
Author:
Publisher: ASM International
Published: 2010-01-01
Total Pages: 487
ISBN-13: 1615037276
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ISTFA 2009
Author:
Publisher: ASM International
Published: 2009-01-01
Total Pages: 371
ISBN-13: 1615030921
DOWNLOAD EBOOKThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
ISTFA 2011
Author:
Publisher: ASM International
Published: 2011
Total Pages: 479
ISBN-13: 1615038507
DOWNLOAD EBOOKIstfa 2003
Author: ASM International
Publisher: ASM International
Published: 2003-01-01
Total Pages: 534
ISBN-13: 1615030867
DOWNLOAD EBOOKISTFA 2012
Author: ASM International
Publisher: ASM International
Published: 2012
Total Pages: 643
ISBN-13: 1615039953
DOWNLOAD EBOOKISTFA 2014
Author: A. S. M. International
Publisher: ASM International
Published: 2014-11-01
Total Pages: 561
ISBN-13: 1627080740
DOWNLOAD EBOOKThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
ISTFA 2013
Author: A. S. M. International
Publisher: ASM International
Published: 2013-01-01
Total Pages: 634
ISBN-13: 1627080228
DOWNLOAD EBOOKThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
ISTFA 2010
Author:
Publisher:
Published: 2010
Total Pages: 464
ISBN-13: 9781680155105
DOWNLOAD EBOOKISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Published: 2018-12-01
Total Pages:
ISBN-13: 1627080996
DOWNLOAD EBOOKThe International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Published: 2019-12-01
Total Pages: 540
ISBN-13: 1627082735
DOWNLOAD EBOOKThe theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
