ISTFA 2009
ISTFA 2009

Author:

Publisher: ASM International

Published: 2009-01-01

Total Pages: 371

ISBN-13: 1615030921

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

ISTFA 2014
ISTFA 2014

Author: A. S. M. International

Publisher: ASM International

Published: 2014-11-01

Total Pages: 561

ISBN-13: 1627080740

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

Author:

Publisher: ASM International

Published: 2019-12-01

Total Pages: 540

ISBN-13: 1627082735

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

ISTFA 2013
ISTFA 2013

Author: A. S. M. International

Publisher: ASM International

Published: 2013-01-01

Total Pages: 634

ISBN-13: 1627080228

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

ISTFA 2012
ISTFA 2012

Author: ASM International

Publisher: ASM International

Published: 2012

Total Pages: 643

ISBN-13: 1615039953

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ISTFA 2007
ISTFA 2007

Author: ASM International

Publisher: ASM International(OH)

Published: 2007

Total Pages: 356

ISBN-13: 9780871708632

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