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Author: Marc De Graef
Publisher: Cambridge University Press
Published: 2003-03-27
Total Pages: 741
ISBN-13: 0521620066
DOWNLOAD EBOOKA graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author: Marc De Graef
Publisher:
Published: 2003
Total Pages: 718
ISBN-13: 9780511556029
DOWNLOAD EBOOKThis graduate level textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text.
Author: Marc De Graef
Publisher: Cambridge University Press
Published: 2003-03-27
Total Pages: 718
ISBN-13: 9780521629959
DOWNLOAD EBOOKA graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author: Dr Robert Keyse
Publisher: Routledge
Published: 2018-12-19
Total Pages: 127
ISBN-13: 1351436619
DOWNLOAD EBOOK1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Author: Jürgen Thomas
Publisher: Springer Science & Business
Published: 2014-04-17
Total Pages: 357
ISBN-13: 9401786011
DOWNLOAD EBOOKThis work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.
Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
Published: 2011-03-24
Total Pages: 764
ISBN-13: 1441972005
DOWNLOAD EBOOKScanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Rolf Erni
Publisher: World Scientific Publishing Company
Published: 2015-03-23
Total Pages: 432
ISBN-13: 1783265302
DOWNLOAD EBOOKAberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.
Author: Pamela E. Champness
Publisher: Garland Pub
Published: 2001
Total Pages: 170
ISBN-13: 9781859961476
DOWNLOAD EBOOKAn introductory level guide to electron diffraction in the TEM - This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached. * Gives useful case studies and examples to guide the new user * User-friendly approach with simple explanations and informative illustrations Explains the basic methods of how to obtain images and patterns with the TEM, and how to interpret them. TAMs are used in many labs, and allow users to explore the structure of a specimen of interest (e.g. a section through a particular material, crystal or tissue). The TEM is used to pass electrons through a sample, and the electrons are scattered or diffracted in order to produce an image. This book looks at the patterns produced by diffracted electrons to study the appearance, orientation and structure of the sample.
Author: Robert Keyse
Publisher: CRC Press
Published: 2018-06-28
Total Pages:
ISBN-13: 9781138441514
DOWNLOAD EBOOKSTEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Author: Ray Egerton
Publisher: Springer Science & Business Media
Published: 2011-02-11
Total Pages: 224
ISBN-13: 9780387258003
DOWNLOAD EBOOKScanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
