International Symposium for Testing and Failure Analysis 1984
Author:
Publisher:
Published: 1984
Total Pages: 335
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author:
Publisher:
Published: 1984
Total Pages: 335
ISBN-13:
DOWNLOAD EBOOKAuthor: Douglas E. McCormac
Publisher:
Published: 1984
Total Pages: 336
ISBN-13:
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Publisher: ASM International
Published: 2019-12-01
Total Pages: 540
ISBN-13: 1627082735
DOWNLOAD EBOOKThe theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 256
ISBN-13: 1461549191
DOWNLOAD EBOOKThis "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Author: ASM International
Publisher: ASM International
Published: 2001-01-01
Total Pages: 456
ISBN-13: 1615030859
DOWNLOAD EBOOKAuthor: ASM International
Publisher: ASM International
Published: 2017-12-01
Total Pages: 666
ISBN-13: 1627081518
DOWNLOAD EBOOKThe theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author: ASM International
Publisher: ASM International
Published: 2008-01-01
Total Pages: 551
ISBN-13: 1615030913
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