High Frequency Measurements and Noise in Electronic Circuits

High Frequency Measurements and Noise in Electronic Circuits

Author: Douglas C. Smith

Publisher: Springer Science & Business Media

Published: 1992-12-31

Total Pages: 252

ISBN-13: 0442006365

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This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of a measurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits.


High-Frequency Circuit Design and Measurements

High-Frequency Circuit Design and Measurements

Author: P. Yip

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 236

ISBN-13: 9401169500

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An elective course in the final-year BEng progamme in electronic engin eering in the City Polytechnic of Hong Kong was generated in response to the growing need of local industry for graduate engineers capable of designing circuits and performing measurements at high frequencies up to a few gigahertz. This book has grown out from the lecture and tutorial materials written specifically for this course. This course should, in the opinion of the author, best be conducted if students can take a final-year design project in the same area. Examples of projects in areas related to the subject matter of this book which have been completed successfully in the last two years that the course has been run include: low-noise amplifiers, dielectric resonator-loaded oscillators and down converters in the 12 GHz as well as the 1 GHz bands; mixers; varactor-tuned and non-varactor-tuned VCOs; low-noise and power amplifiers; and filters and duplexers in the 1 GHz, 800 MHz and 500 MHz bands. The book is intended for use in a course of forty lecture hours plus twenty tutorial hours and the prerequisite expected of the readers is a general knowledge of analogue electronic circuits and basic field theory. Readers with no prior knowledge in high-frequency circuits are recom mended to read the book in the order that it is arranged. ~ ______ In_t_ro_d_u_c_tl_·o_n ______ ~1 ~ 1.


High-Frequency Characterization of Electronic Packaging

High-Frequency Characterization of Electronic Packaging

Author: Luc Martens

Publisher: Springer Science & Business Media

Published: 1998-10-31

Total Pages: 174

ISBN-13: 0792383079

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High-Frequency Characterization of Electronic Packaging will be of interest to researchers and designers of high-frequency electronic packaging. Understanding high-frequency behavior of packaging is of growing importance due to higher clock-speeds in computers and higher data transmission rates in broadband telecommunication systems. Basic knowledge of the high-frequency behavior of packaging and interconnects is, therefore, indispensable for the design of future telecommunication and computer systems. High-Frequency Characterization of Electronic Packaging gives the reader an insight into how high-frequency characterization of electronic packaging should be done and describes the problems that have to be tackled, especially in performing accurate measurements on modern IC-packages and in determination of circuit models. High-Frequency Characterization of Electronic Packaging is conceived as a comprehensive guide for the start of research and to help in performing high-frequency measurements. Important notions in high- frequency characterization such as S-parameters, calibration, probing, de-embedding and measurement-based modeling are explained. The described techniques are illustrated with several up-to-date examples.


High Frequency Electromagnetic Dosimetry

High Frequency Electromagnetic Dosimetry

Author: David A. Sánchez-Hernández

Publisher: Artech House

Published: 2009

Total Pages: 275

ISBN-13: 1596933976

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Along with the growth of RF and microwave technology applications, there is a mounting concern about the possible adverse effects over human health from electromagnetic radiation. Addressing this issue and putting it into perspective, this groundbreaking resource provides critical details on the latest advances in high frequency electromagnetic dosimetry. The book takes a scientific and rigorous engineering point of view, helping you achieve highly accurate exposure assessments.


High Frequency Techniques

High Frequency Techniques

Author: Joseph F. White

Publisher: John Wiley & Sons

Published: 2016-08-01

Total Pages: 524

ISBN-13: 1119244501

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This textbook is an introduction to microwave engineering. The scope of this book extends from topics for a first course in electrical engineering, in which impedances are analyzed using complex numbers, through the introduction of transmission lines that are analyzed using the Smith Chart, and on to graduate level subjects, such as equivalent circuits for obstacles in hollow waveguides, analyzed using Green’s Functions. This book is a virtual encyclopedia of circuit design methods. Despite the complexity, topics are presented in a conversational manner for ease of comprehension. The book is not only an excellent text at the undergraduate and graduate levels, but is as well a detailed reference for the practicing engineer. Consider how well informed an engineer will be who has become familiar with these topics as treated in High Frequency Techniques: (in order of presentation) Brief history of wireless (radio) and the Morse code U.S. Radio Frequency Allocations Introduction to vectors AC analysis and why complex numbers and impedance are used Circuit and antenna reciprocity Decibel measure Maximum power transfer Skin effect Computer simulation and optimization of networks LC matching of one impedance to another Coupled Resonators Uniform transmission lines for propagation VSWR, return Loss and mismatch error The Telegrapher Equations (derived) Phase and Group Velocities The Impedance Transformation Equation for lines (derived) Fano's and Bode's matching limits The Smith Chart (derived) Slotted Line impedance measurement Constant Q circles on the Smith Chart Approximating a transmission line with lumped L's and C's ABCD, Z, Y and Scattering matrix analysis methods for circuits Statistical Design and Yield Analysis of products Electromagnetic Fields Gauss's Law Vector Dot Product, Divergence and Curl Static Potential and Gradient Ampere's Law and Vector Curl Maxwell's Equations and their visualization The Laplacian Rectangular, cylindrical and spherical coordinates Skin Effect The Wave Equation The Helmholtz Equations Plane Propagating Waves Rayleigh Fading Circular (elliptic) Polarization Poynting's Theorem EM fields on Transmission Lines Calculating the impedance of coaxial lines Calculating and visualizing the fields in waveguides Propagation constants and waveguide modes The Taylor Series Expansion Fourier Series and Green's Functions Higher order modes and how to suppress them Vector Potential and Retarded Potentials Wire and aperture antennas Radio propagation and path loss Electromagnetic computer simulation of structures Directional couplers The Rat Race Hybrid Even and Odd Mode Analysis applied to the backward wave coupler Network analyzer impedance and transmission measurements Two-port Scattering Parameters (s matrix) The Hybrid Ring coupler The Wilkinson power divider Filter design: Butterworth, Maximally flat & Tchebyscheff responses Filter Q Diplexer, Bandpass and Elliptic filters Richard's Transformation & Kuroda’s Identities Mumford's transmission line stub filters Transistor Amplifier Design: gain, biasing, stability, and conjugate matching Noise in systems, noise figure of an amplifier cascade Amplifier non-linearity, and spurious free dynamic range Statistical Design and Yield Analysis


Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics

Author: T. Mitch Wallis

Publisher: Cambridge University Press

Published: 2017-09-14

Total Pages: 329

ISBN-13: 1108326315

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Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.