Handbook for Robustness Validation of Automotive Electrical/Electronic Modules

Handbook for Robustness Validation of Automotive Electrical/Electronic Modules

Author: Automotive Electronic Systems Reliability Standards

Publisher:

Published: 2012

Total Pages: 0

ISBN-13:

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This document addresses robustness of electrical/electronic modules for use in automotive applications. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily deals with electrical/electronic modules (EEMs), but can easily be adapted for use on mechatronics, sensors, actuators and switches. EEM qualification is the main scope of this document. Other procedures addressing random failures are specifically addressed in the CPI (Component Process Interaction) section 10. This document is to be used within the context of the Zero Defect concept for component manufacturing and product use.It is recommended that the robustness of semiconductor devices and other components used in the EEM be assured using SAE J1879 OCT2007, Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications.The emphasis of this document is on hardware and manufacturing failure mechanisms, however, other contemporary issues as shown in Figure 1 need to be addressed for a thorough Robustness Validation. A Pareto of contemporary issues is shown in Figure 1. Although this document addresses many of the issues shown, however some are outside the scope of this document and will need to be addressed for a thorough RV process application. Examples of issues outside the scope of this document are system interactions, interfaces, functionality, HMI (Human-Machine Interface) and software. At the time of publication of this handbook, a system level Robustness Validation handbook, which addresses these issues, had been initiated. In late 2006 Members of the SAE International Automotive Electronic Systems Reliability Standards Committee and ZVEI (German Electrical and Electronic Manufacturers` Association) formed a joint task force to update SAE Recommended Practice J1211 NOV1978 "Recommended Environmental Practices for Electronic Equipment Design." The 1978 of version of SAE J1211* was written in an era when electronics were first being introduced to the automobile. There was a high level of concern that the harsh environmental conditions experienced in locations in the vehicle could have a serious negative affect on the reliability of electronic components and systems. Some early engine control modules (ECMs) had failure rates in the 350 failures per million hours (f/106 hrs) range, or expressed in the customer's terms, a 25% probability of failure in the first 12 months of vehicle ownership. At that time, warranty data was presented in R/100 (repairs per 100 vehicles) units, for example, 25 R/100 at 12 months.In these early years, when the automotive electronics industry was in it's infancy, a large percentage of these were "hard" catastrophic and intermittent failures exacerbated by exposure to environmental extremes of temperature (40 °C to +85 °C); high mechanical loads from rough road vibration and rail shipment; mechanical shocks of up to 100g from handling and crash impact; severe electrical transients, electrostatic discharge and electromagnetic interference; large swings in electrical supply voltage; reverse electrical supply voltage; and exposure to highly corrosive chemicals (e.g., road salt and battery acid). The focus of the 1978 version of J1211 was on characterizing these harsh vehicle environment for areas of the vehicle (engine compartment, instrument panel, passenger compartment, truck, under body, etc.) and suggesting lab test methods which design engineers could use to evaluate the performance of their components and systems at or near the worst-case conditions expected in the area of the vehicle where their electrical/electronic components would be mounted. By testing their prototypes at the worst case conditions (i.e., at the product's specification limits) described in the 1978 version of J1211 designers were able to detect and design out weaknesses and thereby reduce the likelihood of failure due to environmental factors.By the mid-1980s, it became common practice to specify "test-to-pass" (zero failures allowed) environmental conditions-based reliability demonstration life tests with acceptance levels in the 90% to 95% reliability range (with confidence levels of 70% to 90%). This translates to approximately 5 to 20 f/106 hrs. The sample size for these tests was determined using binomial distribution statistical tables and this would result in a requirement to test 6 to 24 test units without experiencing a failure. If a failure occurred, the sample size would have to be increased and the testing continued without another failure till the "bogie" was reached. The environmental conditions during the test were typically defined such that the units under test were operated at specification limits based on J1211 recommended practices (e.g., 40°C and +85°C) for at least some portion of the total test time. The "goal" of passing such a demonstration test was often very challenging and the "test-analyze-fix" programs that resulted, although very time-consuming and expensive, produced much-needed reliability growth. Reliability improved significantly in the late 1980s and early 1990s and vehicle manufactures and their suppliers began expressing warranty data in R/1000 units instead of R/100 units.By the turn of the century automobile warranty periods had increased from 12 months to 3, 4, 5 (and even 10 years for some systems) and most manufacturers had started specifying life expectancies for vehicle components of 10, 15 and sometimes 20 years. And by this time several vehicle manufacturers and their best electrical/electronic component suppliers had improved reliability to the point where warranty data was being expressed in parts-per-million (ppm) in the triple, double and even single-digit range. This translates to failure rates in the 0.05 f/106 hrs range and better! The achievement of such high reliability is not the result of test-to-pass reliability demonstration testing based on binomial distribution statistical tables. With this method, reliability demonstration in the 99.99% to 99.9999% range would require thousands of test units! On the contrary, the methods and techniques used by engineering teams achieving such reliability excellence did not require increasingly large sample sizes, more expensive and lengthy testing, or more engineers. It is about working smarter, not harder; and about systems-level robust design and robustness validation thinking rather than component-level "test-to-pass" thinking.The task force leaders and members were of the strong opinion that the 2008 version of SAE J1211 should document the state-of-the-art methods and techniques being used by leading companies and engineering teams to achieve ultra-high reliability while at the same time reducing overall cost life-cycle and shortening time-to-market. The SAE International Automotive Electronic Systems Reliability Standards Committee and ZVEI (German Electrical and Electronic Manufacturers` Association) are hopeful that this Handbook for Robustness Validation of Automotive Electrical/Electronic Modules will help many companies and engineering teams make the transition from the 1980s "cookbook" reliability demonstration approach to a more effective, economically feasible knowledge-based Robustness Validation approach.* Relevant information and data from SAE J1211 NOV1978 is preserved in SAE J2837 "Environmental Conditions and Design Practices for Automotive Electronic Equipment: Reference Data from SAE J1211 NOV1978"


(R) Handbook for Robustness Validation of Automotive Electrical/electronic Modules

(R) Handbook for Robustness Validation of Automotive Electrical/electronic Modules

Author:

Publisher:

Published: 2012

Total Pages: 126

ISBN-13:

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"This document addresses robustness of electrical/electronic modules for use in automotive applications. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily deals with electrical/electronic modules (EEMs), but can easily be adapted for use on mechatronics, sensors, actuators and switches. EEM qualification is the main scope of this document. Other procedures addressing random failures are specifically addressed in the CPI (Component Process Interaction) section 10. This document is to be used within the context of the Zero Defect concept for component manufacturing and product use. It is recommended that the robustness of semiconductor devices and other components used in the EEM be assured using SAE J1879 OCT2007, Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications. The emphasis of this document is on hardware and manufacturing failure mechanisms, however, other contemporary issues as shown in Figure 1 need to be addressed for a thorough Robustness Validation. A Pareto of contemporary issues is shown in Figure 1. Although this document addresses many of the issues shown, however some are outside the scope of this document and will need to be addressed for a thorough RV process application. Examples of issues outside the scope of this document are system interactions, interfaces, functionality, HMI (Human-Machine Interface) and software. At the time of publication of this handbook, a system level Robustness Validation handbook, which addresses these issues, had been initiated"--Publisher's website.


Advanced Microsystems for Automotive Applications 2009

Advanced Microsystems for Automotive Applications 2009

Author: Gereon Meyer

Publisher: Springer Science & Business Media

Published: 2009-04-15

Total Pages: 477

ISBN-13: 3642007457

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The current economic crisis is cutting the automotive sector to the quick. Public authorities worldwide are now faced with requests for providing loans and accepting guarantees and even for putting large automotive companies under state control. Assessing the long-term benefits of such help and wei- ing the needs of different sectors against each other poses a major challenge for the national policies. Given the upcoming change of customer preferences and state regulations towards safety, sustainability and comfort of a car, the automotive industry is particularly called to prove its ability to make nec- sary innovations available in order to accelerate its pace to come out of the crisis. Consequently the Green Car is assuming a prominent role in the current debate. Various power train concepts are currently under discussion for the Green Car including extremely optimised internal combustion engines, hybrid drives and battery-electric traction. Electrical cars are the most appealing option because they are free of local emissions and provide the opportunity to use primary energy from sources other than crude oil for transport. Well to wheel analysis show that their green-house gas emissions can be rated negligibly small if electricity from renewable sources like wind and solar is used.


SAE International's Dictionary of Testing, Verification, and Validation

SAE International's Dictionary of Testing, Verification, and Validation

Author: Jon M. Quigley

Publisher: SAE International

Published: 2023-10-30

Total Pages: 463

ISBN-13: 1468605909

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Created to elevate expertise in testing, verification, and validation with industry-specific terminology, readers are empowered to navigate the complex world of quality assurance. From foundational concepts to advanced principles, each entry provides clarity and depth, ensuring the reader becomes well-versed in the language of precision. This dictionary is an indispensable companion for both professionals and students seeking to unravel the nuances of testing methodologies, verification techniques, and validation processes. Readers will be equipped with the tools to communicate effectively, make informed decisions, and excel in projects. In addition, references to SAE Standards are included to direct the read to additional information beyond a practical definition. (ISBN 9781468605907, ISBN 9781468605914, ISBN 9781468605921, DOI 10.4271/9781468605914)


Next Generation HALT and HASS

Next Generation HALT and HASS

Author: Kirk A. Gray

Publisher: John Wiley & Sons

Published: 2016-03-08

Total Pages: 296

ISBN-13: 1118700201

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Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.


Semiconductor Power Devices

Semiconductor Power Devices

Author: Josef Lutz

Publisher: Springer Science & Business Media

Published: 2011-01-15

Total Pages: 539

ISBN-13: 3642111254

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Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.


The Safety of Controllers, Sensors, and Actuators

The Safety of Controllers, Sensors, and Actuators

Author: Juan Pimentel

Publisher: SAE International

Published: 2019-03-07

Total Pages: 222

ISBN-13: 0768098181

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Safety has been ranked as the number one concern for the acceptance and adoption of automated vehicles since safety has driven some of the most complex requirements in the development of self-driving vehicles. Recent fatal accidents involving self-driving vehicles have uncovered issues in the way some automated vehicle companies approach the design, testing, verification, and validation of their products. Traditionally, automotive safety follows functional safety concepts as detailed in the standard ISO 26262. However, automated driving safety goes beyond this standard and includes other safety concepts such as safety of the intended functionality (SOTIF) and multi-agent safety. The Safety of Controllers, Sensors, and Actuators addresses the concept of safety for self-driving vehicles through the inclusion of 10 recent and highly relevent SAE technical papers. Topics that these papers feature include risk reduction techniques in semiconductor-based systems, component certification, and safety assessment and audits for vehcicle components. As the fifth title in a series on automated vehicle safety, this contains introductory content by the Editor with 10 SAE technical papers specifically chosen to illuminate the specific safety topic of that book.


Reliability Characterisation of Electrical and Electronic Systems

Reliability Characterisation of Electrical and Electronic Systems

Author:

Publisher: Elsevier

Published: 2014-12-24

Total Pages: 274

ISBN-13: 1782422250

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This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation