Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition
Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

Author: Vitalij Pecharsky

Publisher: Springer Science & Business Media

Published: 2008-11-26

Total Pages: 751

ISBN-13: 0387095780

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A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .

Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition
Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

Author: Vitalij Pecharsky

Publisher: Springer Science & Business Media

Published: 2008-11-24

Total Pages: 751

ISBN-13: 0387095799

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A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .

X-Ray Diffraction for Materials Research
X-Ray Diffraction for Materials Research

Author: Myeongkyu Lee

Publisher: CRC Press

Published: 2017-03-16

Total Pages: 302

ISBN-13: 1315361973

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X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Structure of Materials
Structure of Materials

Author: Marc De Graef

Publisher: Cambridge University Press

Published: 2012-10-08

Total Pages: 773

ISBN-13: 1139560476

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This highly readable, popular textbook for upper undergraduates and graduates comprehensively covers the fundamentals of crystallography and symmetry, applying these concepts to a large range of materials. New to this edition are more streamlined coverage of crystallography, additional coverage of magnetic point group symmetry and updated material on extraterrestrial minerals and rocks. New exercises at the end of chapters, plus over 500 additional exercises available online, allow students to check their understanding of key concepts and put into practice what they have learnt. Over 400 illustrations within the text help students visualise crystal structures and more abstract mathematical objects, supporting more difficult topics like point group symmetries. Historical and biographical sections add colour and interest by giving an insight into those who have contributed significantly to the field. Supplementary online material includes password-protected solutions, over 100 crystal structure data files, and Powerpoints of figures from the book.

Structure Determination from Powder Diffraction Data
Structure Determination from Powder Diffraction Data

Author: William I. F. David

Publisher: OUP Oxford

Published: 2002

Total Pages: 358

ISBN-13: 0198500912

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Our understanding of the properties of materials, from drugs and proteins to catalysts and ceramics, is almost always based on structural information. This book describes the new developments in the realm of powder diffraction which make it possible for scientists to obtain such information even from polycrystalline materials. Written and edited by experts active in the field, and covering both the fundamental and applied aspects of structure solution from powder diffraction data, this book guides both novices and experienced practitioners alike through the maze of possibilities.

Elements of X-Ray Diffraction
Elements of X-Ray Diffraction

Author: Bernard D. Cullity

Publisher: Pearson

Published: 2013-11-01

Total Pages: 656

ISBN-13: 9781292040547

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Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader

Materials Chemistry
Materials Chemistry

Author: Bradley D. Fahlman

Publisher: Springer

Published: 2018-08-28

Total Pages: 817

ISBN-13: 9402412557

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The 3rd edition of this successful textbook continues to build on the strengths that were recognized by a 2008 Textbook Excellence Award from the Text and Academic Authors Association (TAA). Materials Chemistry addresses inorganic-, organic-, and nano-based materials from a structure vs. property treatment, providing a suitable breadth and depth coverage of the rapidly evolving materials field — in a concise format. The 3rd edition offers significant updates throughout, with expanded sections on sustainability, energy storage, metal-organic frameworks, solid electrolytes, solvothermal/microwave syntheses, integrated circuits, and nanotoxicity. Most appropriate for Junior/Senior undergraduate students, as well as first-year graduate students in chemistry, physics, or engineering fields, Materials Chemistry may also serve as a valuable reference to industrial researchers. Each chapter concludes with a section that describes important materials applications, and an updated list of thought-provoking questions.

Materials Characterization
Materials Characterization

Author: Yang Leng

Publisher: John Wiley & Sons

Published: 2009-03-04

Total Pages: 384

ISBN-13: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

X-Ray Line Profile Analysis in Materials Science
X-Ray Line Profile Analysis in Materials Science

Author: Gubicza, Jen?

Publisher: IGI Global

Published: 2014-03-31

Total Pages: 359

ISBN-13: 1466658533

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Polymorphism in Molecular Crystals
Polymorphism in Molecular Crystals

Author: Joel Bernstein

Publisher: Oxford University Press

Published: 2002

Total Pages: 429

ISBN-13: 0198506058

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Polymorphism - the multiplicity of structures or forms - is a term that is used in many disciplines. In chemistry it refers to the existence of more than one crystal structure for a particular chemical substance. The properties of a substance are determined by its composition and by its structure. In the last two decades, there has been a sharp rise in the interest in polymorphic systems, as an intrinsically interesting phenomenon and as an increasingly important component in the development and marketing of a variety of materials based on organic molecules (e.g. pharmaceuticals, dyes and pigments, explosives, etc.). This book summarizes and brings up to date the current knowledge and understanding of polymorphism of molecular crystals, and concentrates it in one comprehensive source. The book will be an invaluable reference for students, researchers, and professionals in the field.