Fifth International Symposium on Control of Semiconductor Interfaces
Author: Yukio Yasuda
Publisher:
Published: 2008
Total Pages:
ISBN-13:
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Author: Yukio Yasuda
Publisher:
Published: 2008
Total Pages:
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DOWNLOAD EBOOKAuthor: Junichi Murota
Publisher:
Published: 2008
Total Pages:
ISBN-13:
DOWNLOAD EBOOKAuthor: Junichi Murota
Publisher:
Published: 2008
Total Pages: 279
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1994
Total Pages:
ISBN-13:
DOWNLOAD EBOOKAuthor: Jerzy Rużyłło
Publisher: The Electrochemical Society
Published: 1998
Total Pages: 668
ISBN-13: 9781566771887
DOWNLOAD EBOOKAuthor: M. Cahay
Publisher:
Published: 1999
Total Pages: 712
ISBN-13:
DOWNLOAD EBOOKAuthor: Iwao Ohdomari
Publisher: Elsevier Publishing Company
Published: 1994-01-01
Total Pages: 583
ISBN-13: 9780444818898
DOWNLOAD EBOOKThis book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...
Author: I. Ohdomari
Publisher: Elsevier
Published: 2017-05-03
Total Pages: 600
ISBN-13: 1483290484
DOWNLOAD EBOOKThis book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Author: ISCSI. 2, 1996, Karuizawa
Publisher:
Published: 1997
Total Pages: 856
ISBN-13:
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