ESD Basics
ESD Basics

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2012-10-22

Total Pages: 244

ISBN-13: 0470979712

DOWNLOAD EBOOK

Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.

ESD
ESD

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2009-07-01

Total Pages: 411

ISBN-13: 0470747269

DOWNLOAD EBOOK

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, highlighted by case studies of the elements, circuits and system-on-chip (SOC) in today’s products. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.

The ESD Handbook
The ESD Handbook

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2021-03-02

Total Pages: 1168

ISBN-13: 1119233100

DOWNLOAD EBOOK

A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.

System Level ESD Co-Design
System Level ESD Co-Design

Author: Charvaka Duvvury

Publisher: John Wiley & Sons

Published: 2017-05-05

Total Pages: 436

ISBN-13: 1118861884

DOWNLOAD EBOOK

An effective and cost efficient protection of electronic system against ESD stress pulses specified by IEC 61000-4-2 is paramount for any system design. This pioneering book presents the collective knowledge of system designers and system testing experts and state-of-the-art techniques for achieving efficient system-level ESD protection, with minimum impact on the system performance. All categories of system failures ranging from 'hard' to 'soft' types are considered to review simulation and tool applications that can be used. The principal focus of System Level ESD Co-Design is defining and establishing the importance of co-design efforts from both IC supplier and system builder perspectives. ESD designers often face challenges in meeting customers' system-level ESD requirements and, therefore, a clear understanding of the techniques presented here will facilitate effective simulation approaches leading to better solutions without compromising system performance. With contributions from Robert Ashton, Jeffrey Dunnihoo, Micheal Hopkins, Pratik Maheshwari, David Pomerenke, Wolfgang Reinprecht, and Matti Usumaki, readers benefit from hands-on experience and in-depth knowledge in topics ranging from ESD design and the physics of system ESD phenomena to tools and techniques to address soft failures and strategies to design ESD-robust systems that include mobile and automotive applications. The first dedicated resource to system-level ESD co-design, this is an essential reference for industry ESD designers, system builders, IC suppliers and customers and also Original Equipment Manufacturers (OEMs). Key features: Clarifies the concept of system level ESD protection. Introduces a co-design approach for ESD robust systems. Details soft and hard ESD fail mechanisms. Detailed protection strategies for both mobile and automotive applications. Explains simulation tools and methodology for system level ESD co-design and overviews available test methods and standards. Highlights economic benefits of system ESD co-design.

ESD Testing
ESD Testing

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2016-12-19

Total Pages: 323

ISBN-13: 0470511915

DOWNLOAD EBOOK

With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Latchup
Latchup

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2008-04-15

Total Pages: 472

ISBN-13: 9780470516164

DOWNLOAD EBOOK

Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration. Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in increasing demand. This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena. It contains chapters focusing on bipolar physics, latchup theory, latchup and guard ring characterization structures, characterization testing, product level test systems, product level testing and experimental results. Discussions on state-of-the-art semiconductor processes, design layout, and circuit level and system level latchup solutions are also included, as well as: latchup semiconductor process solutions for both CMOS to BiCMOS, such as shallow trench, deep trench, retrograde wells, connecting implants, sub-collectors, heavily-doped buried layers, and buried grids – from single- to triple-well CMOS; practical latchup design methods, automated and bench-level latchup testing methods and techniques, latchup theory of logarithm resistance space, generalized alpha (a) space, beta (b) space, new latchup design methods– connecting the theoretical to the practical analysis, and; examples of latchup computer aided design (CAD) methodologies, from design rule checking (DRC) and logical-to-physical design, to new latchup CAD methodologies that address latchup for internal and external latchup on a local as well as global design level. Latchup acts as a companion text to the author’s series of books on ESD (electrostatic discharge) protection, serving as an invaluable reference for the professional semiconductor chip and system-level ESD engineer. Semiconductor device, process and circuit designers, and quality, reliability and failure analysis engineers will find it informative on the issues that confront modern CMOS technology. Practitioners in the automotive and aerospace industries will also find it useful. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, computer aided design and design integration.

Successful Training in Gastrointestinal Endoscopy
Successful Training in Gastrointestinal Endoscopy

Author: Jonathan Cohen

Publisher: John Wiley & Sons

Published: 2022-04-19

Total Pages: 500

ISBN-13: 1119529689

DOWNLOAD EBOOK

Successful Training in Gastrointestinal Endoscopy Teaches trainee gastroenterologists the endoscopic skills needed to meet the medical training requirements to practice gastroenterology and helps clinical specialists refresh their skills to pass their recertification This book provides all gastroenterologists with the exact set of skills required to perform endoscopy at the highest level. Featuring contributions from internationally recognized leaders in endoscopy education and an endorsement by the World Organization of Digestive Endoscopy, it examines the specific skill sets and procedure-related tasks that must be mastered when learning a particular technique, including: specific descriptions of accessories required; standard training methods for the procedure; optimal utilization of novel learning modalities such as simulators; quality measures and objective parameters for competency; and available tools for assessing competency once training has been completed. Successful Training in Gastrointestinal Endoscopy, Second Edition features 400 high-quality, outstanding color photos to assist with comprehension. It is also complemented by a website containing over 130 annotated teaching videos of both actual procedures and ex-vivo animal model simulations. These videos illustrate, step by step, the proper techniques to be followed, highlighting clinical pearls of wisdom from the experts and the most common mistakes to avoid. Offers comprehensive and practical training guidelines in all the endoscopy procedures and techniques trainee gastroenterologists are required to learn Provides trainees with the skills required to perform endoscopy to the level required by the ACGME in order to practice gastroenterology Presents seasoned gastroenterologists with an outstanding tool to brush up their endoscopy skills and to familiarize them with new trends in safety and competence Includes website with video clips visually demonstrating all the endoscopic procedures step-by-step highlighting common mistakes Endorsed by the World Organization of Digestive Endoscopy Successful Training in Gastrointestinal Endoscopy, Second Edition is an excellent book for all trainee gastroenterologists (particularly endoscopists and colonoscopists) training for board exams. It will also greatly benefit gastroenterology specialists (especially those training for re-certification), as well as internal medicine physicians and trainees.

Plant and Process Engineering 360
Plant and Process Engineering 360

Author: Mike Tooley

Publisher: Elsevier

Published: 2009-12-07

Total Pages: 617

ISBN-13: 1856178412

DOWNLOAD EBOOK

Plant and Process Engineering 360 will be the backbone of any plant, chemical, or process engineer's library. This is a broad area in which engineers need to be familiar with a wide array of techniques, technologies and equipment. Its focus on providing a broad introduction to key systems make the book the first point of reference for engineers who are involved with designing, specifying, maintaining or working with plant, process and control technologies in many sectors, including manufacturing, chemical process, and energy. - A single-source of plant and process equipment information for engineers, providing a 360 degree view of the critical equipment engineers encounter - Enables readers to get up to speed with unfamiliar topics quickly with an overview of important but disparate technologies that are specific to plant engineering - Covers the systems and processes that drive effective and efficient plants and processes - Drawn from authoritative Elsevier resources, this book is a 'first port of call' with breadth and depth of content, from leading figures in the field.

SDGs in the European Region
SDGs in the European Region

Author: Walter Leal Filho

Publisher: Springer Nature

Published: 2023-08-31

Total Pages: 1576

ISBN-13: 3031174615

DOWNLOAD EBOOK

This volume describes the thinking on sustainable development and a variety of initiatives across Europe, illustrating regional efforts to foster sustainable communities and ecological and social innovation. It contains various contributions which showcase examples of thinking, economic and social structures and in consumption and production patterns needed, to implement the SDGs. This book is part of the "100 papers to accelerate the implementation of the UN Sustainable Development Goals initiative".