Electronic Thin-Film Reliability
Electronic Thin-Film Reliability

Author: King-Ning Tu

Publisher: Cambridge University Press

Published: 2010-11-25

Total Pages: 413

ISBN-13: 1139492705

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Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.

Electronic Thin-Film Reliability
Electronic Thin-Film Reliability

Author: King-Ning Tu

Publisher: Cambridge University Press

Published: 2010-11-25

Total Pages: 412

ISBN-13: 9780521516136

DOWNLOAD EBOOK

Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.

The Materials Science of Thin Films
The Materials Science of Thin Films

Author: Milton Ohring

Publisher: Academic Press

Published: 1992

Total Pages: 744

ISBN-13: 9780125249904

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Prepared as a textbook complete with problems after each chapter, specifically intended for classroom use in universities.

Reliability and Failure of Electronic Materials and Devices
Reliability and Failure of Electronic Materials and Devices

Author: Milton Ohring

Publisher: Academic Press

Published: 2014-10-14

Total Pages: 759

ISBN-13: 0080575528

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Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Principles of Vapor Deposition of Thin Films
Principles of Vapor Deposition of Thin Films

Author: Professor K.S. K.S Sree Harsha

Publisher: Elsevier

Published: 2005-12-16

Total Pages: 1173

ISBN-13: 0080480314

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The goal of producing devices that are smaller, faster, more functional, reproducible, reliable and economical has given thin film processing a unique role in technology.Principles of Vapor Deposition of Thin Films brings in to one place a diverse amount of scientific background that is considered essential to become knowledgeable in thin film depostition techniques. Its ultimate goal as a reference is to provide the foundation upon which thin film science and technological innovation are possible.* Offers detailed derivation of important formulae.* Thoroughly covers the basic principles of materials science that are important to any thin film preparation.* Careful attention to terminologies, concepts and definitions, as well as abundance of illustrations offer clear support for the text.

Electronic Packaging Science and Technology
Electronic Packaging Science and Technology

Author: King-Ning Tu

Publisher: John Wiley & Sons

Published: 2021-12-29

Total Pages: 340

ISBN-13: 1119418313

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Must-have reference on electronic packaging technology! The electronics industry is shifting towards system packaging technology due to the need for higher chip circuit density without increasing production costs. Electronic packaging, or circuit integration, is seen as a necessary strategy to achieve a performance growth of electronic circuitry in next-generation electronics. With the implementation of novel materials with specific and tunable electrical and magnetic properties, electronic packaging is highly attractive as a solution to achieve denser levels of circuit integration. The first part of the book gives an overview of electronic packaging and provides the reader with the fundamentals of the most important packaging techniques such as wire bonding, tap automatic bonding, flip chip solder joint bonding, microbump bonding, and low temperature direct Cu-to-Cu bonding. Part two consists of concepts of electronic circuit design and its role in low power devices, biomedical devices, and circuit integration. The last part of the book contains topics based on the science of electronic packaging and the reliability of packaging technology.

Factors Governing Tin Whisker Growth
Factors Governing Tin Whisker Growth

Author: Erika R Crandall

Publisher: Springer Science & Business Media

Published: 2013-08-15

Total Pages: 145

ISBN-13: 3319004700

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Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (including satellite and defense sectors). Due to legislation in the EU, Japan, and the U.S., mandating a gradual shift from lead (Pb)-based to lead-free solders and board finishes, there has been a reemergence of Sn whiskers. Continuing reports of Sn whisker induced failures coupled with the lack of an industry-accepted understanding of whisker growth and/or test methods to identify whisker prone products has made pure/high Sn substitutes a risky proposition in high reliability systems. This thesis is designed to clarify and control the fundamental mechanisms that govern whisker formation. The research focuses on reproducible "laboratory" created whiskers under a variety of rigorously controlled environmental factors such as film thickness, film stress, substrate material, gas environment, and humidity exposure, which are known to play a significant role in whisker production. The ultimate question of how to impede and/or prevent whisker growth is also addressed and shows that whisker prevention is possible via hard metal capping films, which are impenetrable by whiskers.

Theoretical Analyses and Simulations of Characteristics of MOEMS Microelement Arrays for Daylight Steering
Theoretical Analyses and Simulations of Characteristics of MOEMS Microelement Arrays for Daylight Steering

Author: Xiaohui Yang

Publisher: BoD – Books on Demand

Published: 2024-01-01

Total Pages: 146

ISBN-13: 3737611823

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The integration of MOEMS microelement arrays into smart glass for light steering shows promising features and valuable advantages in terms of energy conservation, enhancing lighting conditions, and improving human comfort. This study explores various actuation solutions and concludes that electrostatically actuated MOEMS devices from INA offer rapid actuation speed, minimum energy consumption, long lifetime and high stability.

Kinetics in Nanoscale Materials
Kinetics in Nanoscale Materials

Author: King-Ning Tu

Publisher: John Wiley & Sons

Published: 2014-05-16

Total Pages: 350

ISBN-13: 1118742834

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As the ability to produce nanomaterials advances, it becomes more important to understand how the energy of the atoms in these materials is affected by their reduced dimensions. Written by an acclaimed author team, Kinetics in Nanoscale Materials is the first book to discuss simple but effective models of the systems and processes that have recently been discovered. The text, for researchers and graduate students, combines the novelty of nanoscale processes and systems with the transparency of mathematical models and generality of basic ideas relating to nanoscience and nanotechnology.