Electro Micro-metrology
Author: Jason Vaughn Clark
Publisher:
Published: 2005
Total Pages: 682
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author: Jason Vaughn Clark
Publisher:
Published: 2005
Total Pages: 682
ISBN-13:
DOWNLOAD EBOOKAuthor: M. Edward Motamedi
Publisher: SPIE Press
Published: 2005
Total Pages: 640
ISBN-13: 9780819450210
DOWNLOAD EBOOKThis book introduces the exciting and fast-moving field of MOEMS to graduate students, scientists, and engineers by providing a foundation of both micro-optics and MEMS that will enable them to conduct future research in the field. Born from the relatively new fields of MEMS and micro-optics, MOEMS are proving to be an attractive and low-cost solution to a range of device problems requiring high optical functionality and high optical performance. MOEMS solutions include optical devices for telecommunication, sensing, and mobile systems such as v-grooves, gratings, shutters, scanners, filters, micromirrors, switches, alignment aids, lens arrays, and hermetic wafer-scale optical packaging. An international team of leading researchers contributed to this book, and it presents examples and problems employing cutting-edge MOEM devices. It will inspire researchers to further advance the design, fabrication, and analysis of MOEM systems.
Author: Muammer KoƧ
Publisher: John Wiley & Sons
Published: 2011-05-06
Total Pages: 490
ISBN-13: 1118010566
DOWNLOAD EBOOKThis book is the first of its kind to collectively address design-based and mechanical micro-manufacturing topics in one place. It focuses on design and materials selection, as well as the manufacturing of micro-products using mechanical-based micro-manufacturing process technologies. After addressing the fundamentals and non-metallic-based micro-manufacturing processes in the semiconductor industry, it goes on to address specific metallic-based micro-manufacturing processes, such as: micro-forming, micro-machining, micro-molding, micro-laser processing, micro-layered manufacturing, micro-joining, micro-assembly and materials handling, and microEDM and ECM. The book provides an in-depth understanding of materials behavior at micro-scales and under different micro-scale processing conditions, while also including a wide variety of emerging micro-scale manufacturing issues and examples.
Author: Joanne Surette
Publisher: DIANE Publishing
Published: 1999-04
Total Pages: 85
ISBN-13: 078817701X
DOWNLOAD EBOOKPresents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
Author:
Publisher:
Published: 1997
Total Pages: 154
ISBN-13:
DOWNLOAD EBOOKAuthor: United States. National Bureau of Standards
Publisher:
Published: 1960
Total Pages: 762
ISBN-13:
DOWNLOAD EBOOKAuthor: Wolfgang Osten
Publisher: John Wiley & Sons
Published: 2012-09-10
Total Pages: 471
ISBN-13: 3527648461
DOWNLOAD EBOOKA comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author: Toru Yoshizawa
Publisher: CRC Press
Published: 2009-02-25
Total Pages: 746
ISBN-13: 1420019511
DOWNLOAD EBOOKThe field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.