Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas
Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

Author: Channing C. Ahn

Publisher: John Wiley & Sons

Published: 2006-03-06

Total Pages: 472

ISBN-13: 3527604774

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This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Electron Energy Loss Spectroscopy
Electron Energy Loss Spectroscopy

Author: R. Brydson

Publisher: Garland Science

Published: 2020-08-13

Total Pages: 150

ISBN-13: 1000102319

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Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Transmission Electron Microscopy
Transmission Electron Microscopy

Author: David B. Williams

Publisher: Springer Science & Business Media

Published: 2009-07-31

Total Pages: 805

ISBN-13: 0387765018

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This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

Electron Energy-Loss Spectroscopy in the Electron Microscope
Electron Energy-Loss Spectroscopy in the Electron Microscope

Author: R.F. Egerton

Publisher: Springer Science & Business Media

Published: 2011-07-29

Total Pages: 498

ISBN-13: 1441995838

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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

Analytical Imaging Techniques for Soft Matter Characterization
Analytical Imaging Techniques for Soft Matter Characterization

Author: Vikas Mittal

Publisher: Springer Science & Business Media

Published: 2012-06-23

Total Pages: 195

ISBN-13: 3642304001

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The book aims to describe the microscopic characterization of the soft matter in the light of new advances acquired in the science of microscopy techniques like AFM; SEM; TEM etc. It does not focus on the traditional information on the microscopy methods as well as systems already present in different books, but intends to answer more fundamental questions associated with commercially important systems by using new advances in microscopy. Such questions are generally not answered by other techniques. The contents of the book also reflect this as the chapters are not based on describing only material systems, but are based on the answering the problems or questions arising in their characterization. Both qualitative as well as quantitative analysis using such microscopic techniques is discussed. Moreover, efforts have been made to provide a broader reach as discussions on both polymers as well as biological matter have been included as different sections. Such a text with comprehensive overview of the various characterization possibilities using microscopy methods can serve as a valuable reference for microscopy experts as well as non-experts alike

Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials

Author: Brent Fultz

Publisher: Springer Science & Business Media

Published: 2012-10-13

Total Pages: 764

ISBN-13: 3642297617

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Transmission Electron Microscopy
Transmission Electron Microscopy

Author: C. Barry Carter

Publisher: Springer

Published: 2016-08-24

Total Pages: 543

ISBN-13: 3319266519

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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

ALTECH 95
ALTECH 95

Author: Bernd O. Kolbesen

Publisher: The Electrochemical Society

Published: 1995

Total Pages: 380

ISBN-13: 9781566771221

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High-Resolution Transmission Electron Microscopy
High-Resolution Transmission Electron Microscopy

Author: Peter Buseck

Publisher: Oxford University Press

Published: 1989-02-02

Total Pages: 668

ISBN-13: 0195364651

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This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.