Data-driven Guide to the Analysis of X-ray Photoelectron Spectra Using RxpsG
Data-driven Guide to the Analysis of X-ray Photoelectron Spectra Using RxpsG

Author: Giorgio Speranza

Publisher:

Published: 2023-11

Total Pages: 0

ISBN-13: 9781032284712

DOWNLOAD EBOOK

"This book provides a theoretical background to X-ray Photoelectron Spectroscopy (XPS) and a practical guide to the analysis of the XPS spectra using the RxpsG software, a powerful tool for XPS analysis. Although there are several publications and books illustrating the theory behind X-ray Photoelectron Spectroscopy and the origin of the spectral feature, this book provides an additional practical introduction to the use of RxspG. It illustrates how to use the RxpsG software to perform specific key operations, with figures and examples which the reader can reproduce themselves. The book contains a list of theoretical sections explaining the appearance of the various spectral features (core-lines, Auger components, valence bands, loss features etc). They are accompanied by practical steps so readers can learn how to analyze specific spectral features using the various functions of the RxpsG software. This book is useful guide for researchers in physics, chemistry, and materials science who are looking to begin using X-ray Photoelectron Spectroscopy, in addition to experienced researchers who want to learn how to use RxpsG"--

Data Driven Guide to the Analysis of X-ray Photoelectron Spectra using RxpsG
Data Driven Guide to the Analysis of X-ray Photoelectron Spectra using RxpsG

Author: Giorgio Speranza

Publisher: CRC Press

Published: 2023-11-23

Total Pages: 267

ISBN-13: 1000992810

DOWNLOAD EBOOK

This book provides a theoretical background to X-ray photoelectron spectroscopy (XPS) and a practical guide to the analysis of the XPS spectra using the RxpsG software, a powerful tool for XPS analysis. Although there are several publications and books illustrating the theory behind XPS and the origin of the spectral feature, this book provides an additional practical introduction to the use of RxpsG. It illustrates how to use the RxpsG software to perform specific key operations, with figures and examples which readers can reproduce themselves. The book contains a list of theoretical sections explaining the appearance of the various spectral features (core‐lines, Auger components, valence bands, loss features, etc.). They are accompanied by practical steps, so readers can learn how to analyze specific spectral features using the various functions of the RxpsG software. This book is a useful guide for researchers in physics, chemistry, and material science who are looking to begin using XPS, in addition to experienced researchers who want to learn how to use RxpsG. In the digital format, the spectral data and step-by-step indications are provided to reproduce the examples given in the textbook. RxpsG is a free software for the spectral analysis. Readers can find the installation information and download the package from https://github.com/GSperanza/ website. RxpsG was developed mainly by Giorgio Speranza with the help of his colleague dr. Roberto Canteri working at Fondazione Bruno Kessler. Key Features: Simplifies the use of RxpsG, how it works, and its applications. Demonstrates RxpsG using a reproduction of the graphical interface of RxpsG, showing the steps needed to perform a specific task and the effect on the XPS spectra. Accessible to readers without any prior experience using the RxpsG software. Giorgio Speranza is Senior Researcher at Fondazione Bruno Kessler – Trento Italy, Associate Member of the Italian National Council of Research, and Associate Member of the Department of Industrial Engineering at the University of Trento, Italy.

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Author: Siegfried Hofmann

Publisher: Springer Science & Business Media

Published: 2012-10-25

Total Pages: 544

ISBN-13: 3642273807

DOWNLOAD EBOOK

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

X-ray Photoelectron Spectroscopy
X-ray Photoelectron Spectroscopy

Author: Paul van der Heide

Publisher: John Wiley & Sons

Published: 2011-11-01

Total Pages: 275

ISBN-13: 1118162900

DOWNLOAD EBOOK

This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.

Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy
Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy

Author: D. Briggs

Publisher: Wiley

Published: 1996-07-25

Total Pages: 674

ISBN-13: 9780471953401

DOWNLOAD EBOOK

This is an updated manual covering the theory and practice of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques for surface analysis. Topics covered include historical development; all relevant theory for data interpretation and a description of instrumentation; the major fields of applications, such as metallurgy, polymers, semiconductors, and corrosion science; catalysis; and many appendices of essential data for day-to-day use. This new edition also takes into account improvements in equipment, experimental procedures and data interpretation over the last seven years.