Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectives Describes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memory Written by an authority in NAND flash memory technology, with over 25 years’ experience
Standard-setting, groundbreaking, authoritative, comprehensive—these often overused words perfectly describe The Circuits and Filters Handbook, Third Edition. This standard-setting resource has documented the momentous changes that have occurred in the field of electrical engineering, providing the most comprehensive coverage available. More than 150 contributing experts offer in-depth insights and enlightened perspectives into standard practices and effective techniques that will make this set the first—and most likely the only—tool you select to help you with problem solving. In its third edition, this groundbreaking bestseller surveys accomplishments in the field, providing researchers and designers with the comprehensive detail they need to optimize research and design. All five volumes include valuable information on the emerging fields of circuits and filters, both analog and digital. Coverage includes key mathematical formulas, concepts, definitions, and derivatives that must be mastered to perform cutting-edge research and design. The handbook avoids extensively detailed theory and instead concentrates on professional applications, with numerous examples provided throughout. The set includes more than 2500 illustrations and hundreds of references. Available as a comprehensive five-volume set, each of the subject-specific volumes can also be purchased separately.
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
With the advent of nanometer technologies, circuit performance constraints are becoming ever more stringent. In this context, automated timing analysis and optimization becomes imperative for the design of high-performance circuits that must satisfy a demanding set of constraints. Timing overviews the state of the art in timing analysis and optimization, and is intended to serve as a compendium that can provide an introduction to the uninitiated reader, as a ready reference for a practitioner, or as a source for the accomplished researcher. A comprehensive overview of the basics of timing analysis is provided, and this is augmented with techniques that incorporate physical effects arising in deep submicron and nanometer technologies. The book provides an in-depth treatment of the analysis of interconnect systems, static timing analysis for combinational circuits, timing analysis for sequential circuits, and timing optimization techniques at the transistor and layout levels. The intended audience includes CAD tool developers, graduate students, research professionals, and the merely curious.
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
This book discusses both architecture and circuit design aspects of Delta-Sigma A/D converters, with a special focus on multi-bit implementations. The emphasis is on high-speed high-resolution converters in CMOS for ADSL applications, although the material can also be applied for other specification goals and technologies.
This book describes a new design methodology that allows optimization-based synthesis of RF systems in a hierarchical multilevel approach, in which the system is designed in a bottom-up fashion, from the device level up to the (sub)system level. At each level of the design hierarchy, the authors discuss methods that increase the design robustness and increase the accuracy and efficiency of the simulations. The methodology described enables circuit sizing and layout in a complete and automated integrated manner, achieving optimized designs in significantly less time than with traditional approaches.
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
This book is based on the 18 tutorials presented during the 29th workshop on Advances in Analog Circuit Design. Expert designers present readers with information about a variety of topics at the frontier of analog circuit design, with specific contributions focusing on analog circuits for machine learning, current/voltage/temperature sensors, and high-speed communication via wireless, wireline, or optical links. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
