Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices
Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices

Author: Ephraim Suhir

Publisher: CRC Press

Published: 2021-01-28

Total Pages: 344

ISBN-13: 0429863829

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Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime. Describes how to use the developed methods of analytical predictive modeling to minimize thermal stresses and strains in solder joint of IC devices Shows how to build the preprocessing models in finite-element analyses (FEA) by comparing the FEA and analytical data Covers how to design the most effective test vehicles for testing solder joints Details how to design and organize, in addition to or sometimes even instead of highly accelerated life tests (HALT), highly focused and highly cost-effective failure oriented accelerated testing (FOAT) to understand the physic of failure of solder joint interconnections Outlines how to convert the low cycle fatigue conditions into elastic fatigue conditions and to assess the fatigue lifetime in such cases Illustrates ways to replace time- and labor-consuming, expensive, and possibly misleading temperature cycling tests with simpler and physically meaningful accelerated tests This book is aimed towards professionals in electronic and photonic packaging, electronic and optical materials, materials engineering, and mechanical design.

Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices
Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices

Author: Ephraim Suhir

Publisher:

Published: 2020

Total Pages: 344

ISBN-13: 9781138624733

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"The book addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime. It helps the reader predict and minimize, at the design stage and using analytical modeling concepts and approaches, the stresses and strains in solder joint interconnects of IC devices"--

Solder Joint Reliability
Solder Joint Reliability

Author: John H. Lau

Publisher: Springer Science & Business Media

Published: 2013-11-27

Total Pages: 649

ISBN-13: 1461539102

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Solders have given the designer of modern consumer, commercial, and military electronic systems a remarkable flexibility to interconnect electronic components. The properties of solder have facilitated broad assembly choices that have fueled creative applications to advance technology. Solder is the electrical and me chanical "glue" of electronic assemblies. This pervasive dependency on solder has stimulated new interest in applica tions as well as a more concerted effort to better understand materials properties. We need not look far to see solder being used to interconnect ever finer geo metries. Assembly of micropassive discrete devices that are hardly visible to the unaided eye, of silicon chips directly to ceramic and plastic substrates, and of very fine peripheral leaded packages constitute a few of solder's uses. There has been a marked increase in university research related to solder. New electronic packaging centers stimulate applications, and materials engineering and science departments have demonstrated a new vigor to improve both the materials and our understanding of them. Industrial research and development continues to stimulate new application, and refreshing new packaging ideas are emerging. New handbooks have been published to help both the neophyte and seasoned packaging engineer.

Lead-Free Electronic Solders
Lead-Free Electronic Solders

Author: KV Subramanian

Publisher: Springer Science & Business Media

Published: 2007-06-28

Total Pages: 370

ISBN-13: 0387484337

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Even though the effect of lead contamination on human health has been known for decades, very little attention has been paid to lead-based solders used in electronics until recently. This comprehensive book examines all the important issues associated with lead-free electronic solder. It collects the work of researchers recognized for their significant scientific contributions in the area.

Fundamentals of Lead-Free Solder Interconnect Technology
Fundamentals of Lead-Free Solder Interconnect Technology

Author: Tae-Kyu Lee

Publisher: Springer

Published: 2014-11-05

Total Pages: 266

ISBN-13: 1461492661

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This unique book provides an up-to-date overview of the concepts behind lead-free soldering techniques. Readers will find a description of the physical and mechanical properties of lead-free solders, in addition to lead-free electronics and solder alloys. Additional topics covered include the reliability of lead-free soldering, tin whiskering and electromigration, in addition to emerging technologies and research.

Benefiting from Thermal and Mechanical Simulation in Micro-Electronics
Benefiting from Thermal and Mechanical Simulation in Micro-Electronics

Author: L.J. Ernst

Publisher: Springer Science & Business Media

Published: 2000-12-31

Total Pages: 214

ISBN-13: 9780792372783

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"Benefiting from Thermal and Mechanical Simulation inMicro-Electronics" presents papers from the first internationalconference on this topic, EuroSimE2000. For the first time, peoplefrom the electronics industry, research institutes, software companiesand universities joined together to discuss present and possiblefuture thermal and mechanical related problems and challenges inmicro-electronics; the state-of-the-art methodologies for thermal &mechanical simulation and optimization of micro-electronics; and theperspectives of future simulation and optimization methodologydevelopment.Main areas covered are: - "Benefiting from Thermal and""Mechanical Simulation in Micro-Electronics" is suitable forstudents at graduate level and beyond, and for researchers, designersand specialists in the fields of microelectronics and mechanics.

Assembly and Reliability of Lead-Free Solder Joints
Assembly and Reliability of Lead-Free Solder Joints

Author: John H. Lau

Publisher: Springer Nature

Published: 2020-05-29

Total Pages: 545

ISBN-13: 9811539200

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This book focuses on the assembly and reliability of lead-free solder joints. Both the principles and engineering practice are addressed, with more weight placed on the latter. This is achieved by providing in-depth studies on a number of major topics such as solder joints in conventional and advanced packaging components, commonly used lead-free materials, soldering processes, advanced specialty flux designs, characterization of lead-free solder joints, reliability testing and data analyses, design for reliability, and failure analyses for lead-free solder joints. Uniquely, the content not only addresses electronic manufacturing services (EMS) on the second-level interconnects, but also packaging assembly on the first-level interconnects and the semiconductor back-end on the 3D IC integration interconnects. Thus, the book offers an indispensable resource for the complete food chain of electronics products.

Recent Developments in the Study of Recrystallization
Recent Developments in the Study of Recrystallization

Author: Peter Wilson

Publisher: BoD – Books on Demand

Published: 2013-02-06

Total Pages: 236

ISBN-13: 9535109626

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Recrystallization is a phenomenon moderately well documented in the geological and metallurgical literature. This book provides a timely overview of the latest research and methods in a variety of fields where recrystallization is studied and is an important factor. The main advantage of a new look at these fields is the rapid increase in modern techniques, such as TEM, spectrometers and modeling capabilities, all of which are providing us with far better images and analysis than ever previously possible. This book will be invaluable to a wide range of research scientists; metallurgists looking to improve properties of alloys, those interested in how the latest equipment may be used to image grains and to all those who work with frozen aqueous solutions where recrystallization may be a problem.

Failure Modes and Mechanisms in Electronic Packages
Failure Modes and Mechanisms in Electronic Packages

Author: P. Singh

Publisher: Springer Science & Business Media

Published: 1997-11-30

Total Pages: 398

ISBN-13: 9780412105913

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With the proliferation of packaging technology, failure and reliability have become serious concerns. This invaluable reference details processes that enable detection, analysis and prevention of failures. It provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers and PCB assemblies.

Die-Attach Materials for High Temperature Applications in Microelectronics Packaging
Die-Attach Materials for High Temperature Applications in Microelectronics Packaging

Author: Kim S. Siow

Publisher: Springer

Published: 2019-01-29

Total Pages: 292

ISBN-13: 3319992562

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This book presents the scientific principles, processing conditions, probable failure mechanisms, and a description of reliability performance and equipment required for implementing high-temperature and lead-free die attach materials. In particular, it addresses the use of solder alloys, silver and copper sintering, and transient liquid-phase sintering. While different solder alloys have been used widely in the microelectronics industry, the implementation of sintering silver and transient liquid-phase sintering remains limited to a handful of companies. Hence, the book devotes many chapters to sintering technologies, while simultaneously providing only a cursory coverage of the more widespread techniques employing solder alloys. Addresses the differences between sintering and soldering (the current die-attach technologies), thereby comprehensively addressing principles, methods, and performance of these high-temperature die-attach materials; Emphasizes the industrial perspective, with chapters written by engineers who have hands-on experience using these technologies; Baker Hughes, Bosch and ON Semiconductor, are represented as well as materials suppliers such as Indium; Simultaneously provides the detailed science underlying these technologies by leading academic researchers in the field.