Principles of Electron Optics
Principles of Electron Optics

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2012-12-02

Total Pages: 755

ISBN-13: 0080984169

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The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Electron and Ion Optics
Electron and Ion Optics

Author: Miklos Szilagyi

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 550

ISBN-13: 1461309239

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The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.

Physical Principles of Electron Microscopy
Physical Principles of Electron Microscopy

Author: Ray Egerton

Publisher: Springer Science & Business Media

Published: 2011-02-11

Total Pages: 224

ISBN-13: 9780387258003

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Scanning Electron Microscope Optics and Spectrometers
Scanning Electron Microscope Optics and Spectrometers

Author: Anjam Khursheed

Publisher: World Scientific

Published: 2011

Total Pages: 417

ISBN-13: 9812836675

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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

An Introduction to Hamiltonian Optics
An Introduction to Hamiltonian Optics

Author: H. A. Buchdahl

Publisher: Courier Corporation

Published: 1993-01-01

Total Pages: 392

ISBN-13: 9780486675978

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Accessible study provides detailed account of the Hamiltonian treatment of aberration theory in geometrical optics. Many classes of optical systems defined in terms of their symmetries. Detailed solutions. 1970 edition.

The Beginnings of Electron Microscopy
The Beginnings of Electron Microscopy

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2013-11-06

Total Pages: 654

ISBN-13: 1483284654

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The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.

Introduction to Electron Holography
Introduction to Electron Holography

Author: Edgar Völkl

Publisher: Springer Science & Business Media

Published: 1999

Total Pages: 378

ISBN-13: 9780306449208

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This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging technology. The guide's how to aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A useful bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences complete the study.

Principles of Electron Optics, Volume 3
Principles of Electron Optics, Volume 3

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2022-02-21

Total Pages: 562

ISBN-13: 0128189800

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Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Introduction to Modern Optics
Introduction to Modern Optics

Author: Grant R. Fowles

Publisher: Courier Corporation

Published: 2012-04-25

Total Pages: 356

ISBN-13: 048613492X

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A complete basic undergraduate course in modern optics for students in physics, technology, and engineering. The first half deals with classical physical optics; the second, quantum nature of light. Solutions.

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Author: Rolf Erni

Publisher: World Scientific Publishing Company

Published: 2015-03-23

Total Pages: 432

ISBN-13: 1783265302

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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.