Advanced X-Ray Characterization Techniques
Advanced X-Ray Characterization Techniques

Author: Zainal Arifin Ahmad

Publisher: Trans Tech Publications Ltd

Published: 2012-12-13

Total Pages: 550

ISBN-13: 3038139416

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Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.

X-ray Characterization of Materials
X-ray Characterization of Materials

Author: Eric Lifshin

Publisher: John Wiley & Sons

Published: 2008-07-11

Total Pages: 277

ISBN-13: 3527613757

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Characterization of Crystal Growth Defects by X-Ray Methods
Characterization of Crystal Growth Defects by X-Ray Methods

Author: B.K. Tanner

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 615

ISBN-13: 1475711263

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Advanced Techniques for Materials Characterization
Advanced Techniques for Materials Characterization

Author: A.K. Tyagi

Publisher: Trans Tech Publications Ltd

Published: 2009-01-02

Total Pages: 528

ISBN-13: 303813323X

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Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

Advanced Characterization Techniques for Thin Film Solar Cells
Advanced Characterization Techniques for Thin Film Solar Cells

Author: Daniel Abou-Ras

Publisher: John Wiley & Sons

Published: 2016-07-13

Total Pages: 760

ISBN-13: 3527699015

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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons
Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons

Author: Sunil K Sinha

Publisher: World Scientific

Published: 2021-03-23

Total Pages: 430

ISBN-13: 9811231524

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Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

Materials Characterization
Materials Characterization

Author: Yang Leng

Publisher: John Wiley & Sons

Published: 2009-03-04

Total Pages: 384

ISBN-13: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Anomalous X-Ray Scattering for Materials Characterization
Anomalous X-Ray Scattering for Materials Characterization

Author: Yoshio Waseda

Publisher: Springer

Published: 2003-07-01

Total Pages: 224

ISBN-13: 354046008X

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The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author: Gerhard Huebschen

Publisher: Woodhead Publishing

Published: 2016-03-23

Total Pages: 322

ISBN-13: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials