Measurement is a multidisciplinary experimental science. Measurement systems synergistically blend science, engineering and statistical methods to provide fundamental data for research, design and development, control of processes and operations, and facilitate safe and economic performance of systems. In recent years, measuring techniques have expanded rapidly and gained maturity, through extensive research activities and hardware advancements. With individual chapters authored by eminent professionals in their respective topics, Advanced Topics in Measurements attempts to provide a comprehensive presentation and in-depth guidance on some of the key applied and advanced topics in measurements for scientists, engineers and educators.
Measurement is a multidisciplinary experimental science. Measurement systems synergistically blend science, engineering and statistical methods to provide fundamental data for research, design and development, control of processes and operations, and facilitate safe and economic performance of systems. In recent years, measuring techniques have expanded rapidly and gained maturity, through extensive research activities and hardware advancements. With individual chapters authored by eminent professionals in their respective topics, Advanced Topics in Measurements attempts to provide a comprehensive presentation and in-depth guidance on some of the key applied and advanced topics in measurements for scientists, engineers and educators.
Measurement is a multidisciplinary experimental science. Measurement systems synergistically blend science, engineering and statistical methods to provide fundamental data for research, design and development, control of processes and operations, and facilitate safe and economic performance of systems. In recent years, measuring techniques have expanded rapidly and gained maturity, through extensive research activities and hardware advancements. With individual chapters authored by eminent professionals in their respective topics, Advanced Topics in Measurements attempts to provide a comprehensive presentation and in-depth guidance on some of the key applied and advanced topics in measurements for scientists, engineers and educators.
'Advances in Measurements and Instrumentation: Reviews'Vol. 1 Book Series is covering some aspects related to metrology, sensors, measuring systems and sensor instrumentation as well as related modeling and mathematical tools for measurements in quality control and other applications. The book volume contains seven chapters written by nine contributors from academia and industry from 6 countries: Algeria, Canada, China, Germany, Slovak Republic and United Kingdom. The book will be a valuable tool for those who involved in research and development of various measuring instruments and systems.
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019. The book covers broad aspects of several topics involved in the metrology and measurement of engineering surfaces and their implementation in automotive, bio-manufacturing, chemicals, electronics, energy, construction materials, and other engineering applications. The contents focus on cutting-edge instruments, methods and standards in the field of metrology and mechanical properties of advanced materials. Given the scope of the topics, this book can be useful for students, researchers and professionals interested in the measurement of surfaces, and the applications thereof.
This book is a collection of 24 chapters concerning the developments within the Measurement Systems field of study.The collection includes scholarly contributions by various authors and edited by a group of experts pertinent to Measurement Systems. Each contribution comes as a separate chapter complete in itself but directly related to the book's topics and objectives. The target audience comprises scholars and specialists in the field.
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Advances in Spectroscopic Monitoring of the Atmosphere provides a comprehensive overview of cutting-edge technologies and monitoring applications. Concepts are illustrated by numerous examples with information on spectroscopic techniques and applications widely distributed throughout the text. This information is important for researchers to gain an overview of recent developments in the field and make informed selections among the most suitable techniques. This volume also provides information that will allow researchers to explore implementing and developing new diagnostic tools or new approaches for trace gas and aerosol sensing themselves. Advances in Spectroscopic Monitoring of the Atmosphere covers advanced and newly emerging spectroscopic techniques for optical metrology of gases and particles in the atmosphere. This book will be a valuable reference for atmospheric scientists, including those whose focus is applying the methods to atmospheric studies, and those who develop instrumentation. It will also serve as a useful introduction to researchers entering the field and provide relevant examples to researchers and students developing and applying optical sensors for a variety of other scientific, technical, and industrial uses. Overview of new applications including remote sensing by UAV, laser heterodyne radiometry, dual comb spectroscopy, and more Features in-situ observations and measurements for real-world data Includes content on leading edge optical sensors
