Advanced Mathematical Tools In Metrology - Proceedings Of The International Workshop

Advanced Mathematical Tools In Metrology - Proceedings Of The International Workshop

Author: Nicola Bellomo

Publisher: World Scientific

Published: 1994-05-18

Total Pages: 290

ISBN-13: 9814550957

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This volume will interest researchers and others involved with high-precision measurements and the development of mathematical tools for this purpose. Advances in metrology depend on improvements in scientific and technical knowledge, the quality of instruments, a better use of advanced mathematical tools and the development of new ones.A tradition of close cooperation between metrologists and mathematicians, while found elsewhere, is lacking in Italy. This workshop wishes to start such a cooperation by providing a common meeting ground. Several industrial sectors, particularly those of instrumentation and software, are likely to benefit from this process, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming increasingly important in industrial processes.


Advanced Mathematical Tools In Metrology Iii

Advanced Mathematical Tools In Metrology Iii

Author: Patrizia Ciarlini

Publisher: World Scientific

Published: 1997-08-05

Total Pages: 302

ISBN-13: 9814546712

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This book is of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality as well in a better use of advanced mathematical tools and in the development of new ones. In this book scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming more and more important in industrial processes.


Advanced Mathematical & Computational Tools in Metrology VI

Advanced Mathematical & Computational Tools in Metrology VI

Author: P. Ciarlini

Publisher: World Scientific

Published: 2004

Total Pages: 367

ISBN-13: 9812389040

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This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Science


Advanced Mathematical And Computational Tools In Metrology And Testing Xi

Advanced Mathematical And Computational Tools In Metrology And Testing Xi

Author: Alistair B Forbes

Publisher: World Scientific

Published: 2018-10-16

Total Pages: 458

ISBN-13: 981327431X

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This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.


Advanced Mathematical And Computational Tools In Metrology And Testing Ix

Advanced Mathematical And Computational Tools In Metrology And Testing Ix

Author: Franco Pavese

Publisher: World Scientific

Published: 2012-03-27

Total Pages: 468

ISBN-13: 9814397962

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This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards./a


Advanced Mathematical And Computational Tools In Metrology And Testing X

Advanced Mathematical And Computational Tools In Metrology And Testing X

Author: Franco Pavese

Publisher: World Scientific

Published: 2015-04-22

Total Pages: 446

ISBN-13: 9814678635

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This volume contains original and refereed contributions from the tenth AMCTM Conference (www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.


Recent Advances in Optimization and its Applications in Engineering

Recent Advances in Optimization and its Applications in Engineering

Author: Moritz Diehl

Publisher: Springer Science & Business Media

Published: 2010-09-21

Total Pages: 535

ISBN-13: 3642125980

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Mathematical optimization encompasses both a rich and rapidly evolving body of fundamental theory, and a variety of exciting applications in science and engineering. The present book contains a careful selection of articles on recent advances in optimization theory, numerical methods, and their applications in engineering. It features in particular new methods and applications in the fields of optimal control, PDE-constrained optimization, nonlinear optimization, and convex optimization. The authors of this volume took part in the 14th Belgian-French-German Conference on Optimization (BFG09) organized in Leuven, Belgium, on September 14-18, 2009. The volume contains a selection of reviewed articles contributed by the conference speakers as well as three survey articles by plenary speakers and two papers authored by the winners of the best talk and best poster prizes awarded at BFG09. Researchers and graduate students in applied mathematics, computer science, and many branches of engineering will find in this book an interesting and useful collection of recent ideas on the methods and applications of optimization.


Advanced Mathematical & Computational Tools in Metrology V

Advanced Mathematical & Computational Tools in Metrology V

Author: P. Ciarlini

Publisher: World Scientific

Published: 2001

Total Pages: 396

ISBN-13: 9789810244941

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Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.


Recent Advances in Metrology and Fundamental Constants

Recent Advances in Metrology and Fundamental Constants

Author: T.J. Quinn

Publisher: IOS Press

Published: 2001-12-18

Total Pages: 836

ISBN-13: 1614990026

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The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.