Proceedings of the Third IEEE International Conference on Electronics, Circuits, and Systems
Proceedings of the Third IEEE International Conference on Electronics, Circuits, and Systems

Author:

Publisher:

Published: 1996

Total Pages: 1256

ISBN-13: 9780780336506

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The third a series of annual conferences organized in cooperation with the IEEE Circuits ans Systems Society Region 8 in the Mediterranean area. All aspects of the field of electronics, including analog, digital. solid-state, power, high-speed, biomedical, military and consumer electronics are covered in the 340 papers structures as 54 sessions.

Proceedings of the 2nd International Conference on Emerging Technologies and Intelligent Systems
Proceedings of the 2nd International Conference on Emerging Technologies and Intelligent Systems

Author: Mohammed A. Al-Sharafi

Publisher: Springer Nature

Published: 2022-12-12

Total Pages: 703

ISBN-13: 3031204298

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This book sheds light on the recent research directions in intelligent systems and their applications. It involves four main themes: artificial intelligence and data science, recent trends in software engineering, emerging technologies in education, and intelligent health informatics. The discussion of the most recent designs, advancements, and modifications of intelligent systems, as well as their applications, is a key component of the chapters contributed to the aforementioned subjects.

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Author: Alexandra Zimpeck

Publisher: Springer Nature

Published: 2021-03-10

Total Pages: 131

ISBN-13: 3030683680

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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.