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Published: 2016
Total Pages: 320
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DOWNLOAD EBOOKAnnotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
Author: IEEE Staff
Publisher:
Published: 2016-11-21
Total Pages:
ISBN-13: 9781509038107
DOWNLOAD EBOOKThe Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind
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Published: 2016
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ISBN-13: 9781509038091
DOWNLOAD EBOOKAuthor: Brajesh Kumar Kaushik
Publisher: Springer
Published: 2017-12-21
Total Pages: 820
ISBN-13: 9811074704
DOWNLOAD EBOOKThis book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Author: Lejla Batina
Publisher: Springer Nature
Published: 2022-04-07
Total Pages: 365
ISBN-13: 3030987957
DOWNLOAD EBOOKAI has become an emerging technology to assess security and privacy, with many challenges and potential solutions at the algorithm, architecture, and implementation levels. So far, research on AI and security has looked at subproblems in isolation but future solutions will require sharing of experience and best practice in these domains. The editors of this State-of-the-Art Survey invited a cross-disciplinary team of researchers to a Lorentz workshop in 2019 to improve collaboration in these areas. Some contributions were initiated at the event, others were developed since through further invitations, editing, and cross-reviewing. This contributed book contains 14 invited chapters that address side-channel attacks and fault injection, cryptographic primitives, adversarial machine learning, and intrusion detection. The chapters were evaluated based on their significance, technical quality, and relevance to the topics of security and AI, and each submission was reviewed in single-blind mode and revised.
Author: Xinfei Guo
Publisher: Springer
Published: 2019-06-12
Total Pages: 215
ISBN-13: 3030200515
DOWNLOAD EBOOKThis book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
Author: Patrick Girard
Publisher: Springer Nature
Published: 2023-03-13
Total Pages: 320
ISBN-13: 3031196392
DOWNLOAD EBOOKThis book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Author: Swarup Bhunia
Publisher: Springer
Published: 2017-11-29
Total Pages: 383
ISBN-13: 3319685112
DOWNLOAD EBOOKThis book, for the first time, provides comprehensive coverage on malicious modification of electronic hardware, also known as, hardware Trojan attacks, highlighting the evolution of the threat, different attack modalities, the challenges, and diverse array of defense approaches. It debunks the myths associated with hardware Trojan attacks and presents practical attack space in the scope of current business models and practices. It covers the threat of hardware Trojan attacks for all attack surfaces; presents attack models, types and scenarios; discusses trust metrics; presents different forms of protection approaches – both proactive and reactive; provides insight on current industrial practices; and finally, describes emerging attack modes, defenses and future research pathways.
Author: Mohammed Usman
Publisher: Springer Nature
Published: 2023-03-01
Total Pages: 132
ISBN-13: 9811945225
DOWNLOAD EBOOKThis book sheds light on systems that learn extensively, with purpose and naturally interact with humans. Improving operations and increasing competitive differentiation among manufacturing organizations by harnessing the power of cognitive abilities, IoT can help build and influence the flow of information—making the shop floor more cognitive through effective processing, analysis, and operational optimization. Now we are seeing the first-hand potential of cognitive computing—its ability to transform businesses, governments, and society. The real potential of the cognitive age can be realized by combining data analysis and statistical reasoning of machines with uniquely human qualities, such as self-directed goals, common sense, and moral values, improving operations and increasing competitive differentiation among manufacturing organizations. By harnessing the power of cognitive abilities, IoT can help build and influence the flow of information—making the shop floor more cognitive through effective processing, analysis, and operational optimization. Cognitive initiatives come in all shapes and sizes, from change to strategy and everything in between. What most successful projects have in common, no matter how ambitious, is they start with a clear view of what technology can do. Therefore, the first job of a cognitive scientists is to gain a firm understanding of cognitive abilities, as presented in this book.
Author: George A. Tsihrintzis
Publisher: Springer
Published: 2019-07-06
Total Pages: 552
ISBN-13: 3030156281
DOWNLOAD EBOOKThis book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.
