Nickel-Titanium Smart Hybrid Materials
Nickel-Titanium Smart Hybrid Materials

Author: Sabu Thomas

Publisher: Elsevier

Published: 2022-01-26

Total Pages: 462

ISBN-13: 0323998275

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Nickel-Titanium Smart Hybrid Materials: From Micro- to Nano-structured Alloys for Emerging Applications describes advanced properties that can be adapted in NiTi-alloys. Nickel-Titanium (NiTi) systems are receiving wide demand in growing industries due to their smart, high-temperature or biocompatible behavior. These influenced behaviors are carefully described in the micro-scale and nanoscale range, with NiTi smart materials described on the basis of their shape memory effect (SME) and super-elastic (SE) properties for sensor and actuator application. This book discusses novel properties of nickel-titanium systems, helping materials scientists and engineers produce smart technologies and systems for the aeronautical, automobile, mechanical, healthcare and electronics industries. - Describes the use of nanotechnology and microtechnology in nickel-titanium-based systems - Outlines the major properties of Nickel-Titanium Nanoalloys - Assesses the major challenges of manufacturing nickel-titanium nanoalloys at an industrial scale

Istfa '98
Istfa '98

Author: ASM International

Publisher: ASM International

Published: 1998-01-01

Total Pages: 453

ISBN-13: 161503076X

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ISTFA 2009
ISTFA 2009

Author:

Publisher: ASM International

Published: 2009-01-01

Total Pages: 371

ISBN-13: 1615030921

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

Author: ASM International

Publisher: ASM International

Published: 2018-12-01

Total Pages: 593

ISBN-13: 1627080996

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The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics

Author: Zhiyong Ma

Publisher: CRC Press

Published: 2017-03-27

Total Pages: 889

ISBN-13: 135173394X

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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Machine Learning Support for Fault Diagnosis of System-on-Chip
Machine Learning Support for Fault Diagnosis of System-on-Chip

Author: Patrick Girard

Publisher: Springer Nature

Published: 2023-03-13

Total Pages: 320

ISBN-13: 3031196392

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This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.