Reflection High-Energy Electron Diffraction
Author: Ayahiko Ichimiya
Publisher: Cambridge University Press
Published: 2004-12-13
Total Pages: 370
ISBN-13: 9780521453738
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Applied RHEED
Author: Wolfgang Braun
Publisher: Springer Science & Business Media
Published: 1999-04-16
Total Pages: 240
ISBN-13: 9783540651994
DOWNLOAD EBOOKThe book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
High Energy Electron Diffraction and Microscopy
Author: L.-M. Peng
Publisher: Oxford University Press, USA
Published: 2004
Total Pages: 580
ISBN-13: 9780198500742
DOWNLOAD EBOOKThis book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
Compendium of Surface and Interface Analysis
Author: The Surface Science Society of Japan
Publisher: Springer
Published: 2018-02-19
Total Pages: 807
ISBN-13: 9811061564
DOWNLOAD EBOOKThis book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
In Situ Characterization of Thin Film Growth
Author: Gertjan Koster
Publisher: Elsevier
Published: 2011-10-05
Total Pages: 295
ISBN-13: 0857094955
DOWNLOAD EBOOKAdvanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Author: Zhong Lin Wang
Publisher: Cambridge University Press
Published: 1996-05-23
Total Pages: 457
ISBN-13: 0521482666
DOWNLOAD EBOOKA self-contained book on electron microscopy and spectrometry techniques for surface studies.
Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
Author: P.K. Larsen
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 526
ISBN-13: 146845580X
DOWNLOAD EBOOKThis volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.
Modern Techniques of Surface Science
Author: D. P. Woodruff
Publisher: Cambridge University Press
Published: 1994-03-03
Total Pages: 612
ISBN-13: 9780521424981
DOWNLOAD EBOOKRevised and expanded second edition of the standard work on new techniques for studying solid surfaces.
Transmission Electron Microscopy
Author: C. Barry Carter
Publisher: Springer
Published: 2016-08-24
Total Pages: 543
ISBN-13: 3319266519
DOWNLOAD EBOOKThis text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Advanced Transmission Electron Microscopy
Author: Jian Min Zuo
Publisher: Springer
Published: 2016-10-26
Total Pages: 741
ISBN-13: 1493966073
DOWNLOAD EBOOKThis volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
