Extended Defects in Semiconductors

Extended Defects in Semiconductors

Author: D. B. Holt

Publisher: Cambridge University Press

Published: 2007-04-12

Total Pages: 625

ISBN-13: 1139463594

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A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.


III–V Semiconducting Compounds

III–V Semiconducting Compounds

Author: M. Neuberger

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 120

ISBN-13: 1461596068

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The Electronic Properties Information Center has developed the Data Table as a precis of the most reliable information available for the physical, crystallographic, mechanical, thermal, electronic, magnetic and optical properties of a given material. Data Tables serve as an introduction to the graphic data compilations on the material published by the Electronic Properties Information Center, EPIC, as Data Sheets. Although the Data Sheets are principally concerned, according to the scope of the Center, with electronic and optical data, it is believed that data covering the complete property spectrum is of the first importance to every scientist and engineer, whatever his information requirements. The enthusiastic reception of these Data Tables has confirmed this opinion and increasing requests for this highly selective type of information has resulted in these III·-V Semiconductor Compounds Data Tables. The major problem in this type of selective data compilation on a semiconducting material, lies in the material purity. Properties may vary so widely with doping, crystallinity, defects, geometric forms and the other parameters of preparation, that any attempts at comparison normally fail. On this basis, we have consis tently attempted to give values derived from experiments on the highest purity single crystals or epitaxial films. At the very least, these data should be reproducible and this gives the data their principal validity. If such values however, are not available, then the next best data are reported, together with material speci fications. These latter include the carrier concentration and the dopant.


1991 Solar World Congress

1991 Solar World Congress

Author: S. M. A. Burley

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 590

ISBN-13: 0080984673

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The ISES Solar World Congress, held in Denver, Colorado in August 1991 attracted over 1000 participants from nearly 70 countries, making it the largest solar energy event of its kind in the world. As a lasting record of that congress, 630 papers are published here in 4 volumes of proceedings. Volume 1 is dedicated to solar energy, biofuels and renewable resources. Volume 2 contains papers on active solar and solar heat. Passive solar, socio-economic and educational aspects are considered in Volume 3, and finally the plenary sessions, and the Farrington Daniels lecture are published in Volume 4. 1991 Solar World Congress presents the very latest advances in the utilization of alternative energy resources and technology.


Electronic Properties of Materials

Electronic Properties of Materials

Author: H. Thayne Johnson

Publisher: Springer Science & Business Media

Published: 2013-11-27

Total Pages: 1697

ISBN-13: 1475708394

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HIS FIRST EDITION OF Electronic Properties of Force Materials Laboratory, where Air Force respon T Materials: A Guide to the Literature initiates a sibility for these contracts has resided. Mr. John W. plan for making available the indexing work of the Atwood is Project Manager at Hughes Aircraft Electronic Properties Information Center. Since the Company. inception of EPIC in June, 1961, a basic objective has Professional members of EPIC are Charles L. M. been to use techniques and procedures that would Blocher, Donald L. Grigsby, Dana H. Johnson, allow maximum distribution and use of EPIC output. Thomas J. Lyndon, John T. Milek, Meta S. Neu Accordingly, data processing and reproduction tech berger, and Emil Schafer. All have ably contributed niques were established to reproduce and distribute to this work. Mr. Johnson and Mrs. Neuberger have easily and economically a few copies of what was been primarily responsible for the indexing effort; then a card index. Mr. Lyndon has supervised the classical library pro As the program advanced, it became apparent that cedures and the clerical effort; Mr. Blocher and Mr. a few copies of the index were not enough. The index Grigsby have controlled the indexing vocabulary, the should be available to all, instead of just a select few. cross-references, and the data processing input; and However, this would have meant so many copies that Mr. Schafer has prepared the very excellent glossary, the cost would have drained funds from the program with the assistance of Mr. Milek.