Symposium on X-Ray and Electron Probe Analysis
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Published: 1964
Total Pages: 230
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Published: 1964
Total Pages: 230
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Publisher: ASTM International
Published: 1962
Total Pages: 216
ISBN-13:
DOWNLOAD EBOOKAuthor: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
Published: 2013-06-29
Total Pages: 624
ISBN-13: 3662121085
DOWNLOAD EBOOKThe Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
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Published: 1974
Total Pages: 1064
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DOWNLOAD EBOOKAuthor: Bourdon Francis Scribner
Publisher:
Published: 1966
Total Pages: 112
ISBN-13:
DOWNLOAD EBOOKActivities in optical spectrometry included development of programs for calculations on a time-sharing computer, measurement of arc temperatures, applications of the laser probe and the plasma jet, and studies on atomic absorption spectrometry. In x-ray spectroscopy, there were some modifications of equipment, improvements in computation methods, and several applications. Improvements and additions were made to the electron probe analyzer, along with studies on measurement techniques, including nondispersive analysis and computation procedures. The spark-source mass spectrometer was also modified, and a new analog computer has been built and tested for reduction of photographic plate data; applications of this instrument to analyses of pure materials are described. Enrichment methods are being studied for the analysis of pure materials by emission spectroscopy, particularly with an electro-deposition technique. Homogeneity studies and analyses were performed in the development of standard reference materials. (Author).
Author: J. W. Colby
Publisher:
Published: 1965
Total Pages: 32
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DOWNLOAD EBOOKAuthor: Abrams H.
Publisher: ASTM International
Published: 1986
Total Pages: 244
ISBN-13: 9780803105102
DOWNLOAD EBOOKAuthor: United States. National Bureau of Standards. Spectrochemical Analysis Section
Publisher:
Published: 1966
Total Pages: 112
ISBN-13:
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Publisher:
Published: 1964
Total Pages: 80
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DOWNLOAD EBOOKAuthor: Kurt F. J. Heinrich
Publisher:
Published: 1968
Total Pages: 320
ISBN-13:
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