Defects in Advanced Electronic Materials and Novel Low Dimensional Structures

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures

Author: Jan Stehr

Publisher: Woodhead Publishing

Published: 2018-06-29

Total Pages: 309

ISBN-13: 0081020546

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Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap. - Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayers - Addresses a range of defects in a variety of systems, providing a comparative approach - Includes sections on advances in theory that provide insights on where this body of research might lead


Advanced Electrical and Electronics Materials

Advanced Electrical and Electronics Materials

Author: K. M. Gupta

Publisher: John Wiley & Sons

Published: 2015-02-23

Total Pages: 672

ISBN-13: 111899857X

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This comprehensive and unique book is intended to cover the vast and fast-growing field of electrical and electronic materials and their engineering in accordance with modern developments. Basic and pre-requisite information has been included for easy transition to more complex topics. Latest developments in various fields of materials and their sciences/engineering, processing and applications have been included. Latest topics like PLZT, vacuum as insulator, fiber-optics, high temperature superconductors, smart materials, ferromagnetic semiconductors etc. are covered. Illustrations and examples encompass different engineering disciplines such as robotics, electrical, mechanical, electronics, instrumentation and control, computer, and their inter-disciplinary branches. A variety of materials ranging from iridium to garnets, microelectronics, micro alloys to memory devices, left-handed materials, advanced and futuristic materials are described in detail.


Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures

Author: Giovanni Agostini

Publisher: Elsevier

Published: 2011-08-11

Total Pages: 501

ISBN-13: 0080558151

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In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors


Handbook of Advanced Electronic and Photonic Materials and Devices, Ten-Volume Set

Handbook of Advanced Electronic and Photonic Materials and Devices, Ten-Volume Set

Author: Hari Singh Nalwa

Publisher: Academic Press

Published: 2000-10-09

Total Pages: 383

ISBN-13: 0125137451

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Vol. 1: Semiconductors;Vol. 2: Semiconductors Devices;Vol. 3: High-Tc Superconductors and Organic Conductors; Vol. 4: Ferroelectrics and Dielectrics; Vol. 5: Chalcogenide Glasses and Sol-Gel Materials; Vol. 6 Nanostructured Materials; Vol. 7: Liquid Crystals, Display and Laser Materials; Vol. 8: Conducting Polymers; Vol. 9: Nonlinear Optical Materials; Volume 10: Light-Emitting Diodes, Lithium Batteries and Polymer Devices


Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization

Author: Dieter K. Schroder

Publisher: John Wiley & Sons

Published: 2015-06-29

Total Pages: 800

ISBN-13: 0471739065

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.


Industrial Science and Technology II

Industrial Science and Technology II

Author: Agus Geter Edy Sutjipto

Publisher: Trans Tech Publications Ltd

Published: 2021-03-30

Total Pages: 351

ISBN-13: 3035737576

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Selected peer-reviewed full text papers from the Symposium on Industrial Science and Technology (SISTEC 2020) Selected, peer-reviewed papers from the Postgraduate Symposium on Industrial Science and Technology 2020 (SISTEC 2020), August 26-27, 2020, Kuantan, Malaysia


Advanced Materials Research Vol. 1171

Advanced Materials Research Vol. 1171

Author: Alan Kin Tak Lau

Publisher: Trans Tech Publications Ltd

Published: 2022-05-03

Total Pages: 140

ISBN-13: 3036410562

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This journal's volume contains articles that described the last research results and engineering solutions in applied materials and technologies of materials synthesis and processing. The articles collection will be helpful for engineers and researchers.


Electronic Materials

Electronic Materials

Author: Yuriy M. Poplavko

Publisher: Elsevier

Published: 2018-11-23

Total Pages: 710

ISBN-13: 0128152567

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Mechanical and thermal properties are reviewed and electrical and magnetic properties are emphasized. Basics of symmetry and internal structure of crystals and the main properties of metals, dielectrics, semiconductors, and magnetic materials are discussed. The theory and modern experimental data are presented, as well as the specifications of materials that are necessary for practical application in electronics. The modern state of research in nanophysics of metals, magnetic materials, dielectrics and semiconductors is taken into account, with particular attention to the influence of structure on the physical properties of nano-materials. The book uses simplified mathematical treatment of theories, while emphasis is placed on the basic concepts of physical phenomena in electronic materials. Most chapters are devoted to the advanced scientific and technological problems of electronic materials; in addition, some new insights into theoretical facts relevant to technical devices are presented. Electronic Materials is an essential reference for newcomers to the field of electronics, providing a fundamental understanding of important basic and advanced concepts in electronic materials science. Provides important overview of the fundamentals of electronic materials properties significant for device applications along with advanced and applied concepts essential to those working in the field of electronics Takes a simplified and mathematical approach to theories essential to the understanding of electronic materials and summarizes important takeaways at the end of each chapter Interweaves modern experimental data and research in topics such as nanophysics, nanomaterials and dielectrics