VocEd
Author:
Publisher:
Published: 1985
Total Pages: 306
ISBN-13:
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Author: R. T. Miller
Publisher: American Technical Publishers
Published: 1998
Total Pages: 292
ISBN-13: 9780826915610
DOWNLOAD EBOOKAuthor: Mark Briggs
Publisher: CQ Press
Published: 2013
Total Pages: 366
ISBN-13: 1452227853
DOWNLOAD EBOOKDo you want to help build what's next for journalism? Then jump into Mark Briggs' proven guide for leveraging digital technology to do better journalism. The media landscape changes with such ferocious speed that as soon as new technologies gain a foothold, older ones become obsolete. To keep ahead and abreast of these ever-evolving tools and techniques, Briggs offers practical and timely guidance for both the seasoned professional looking to get up to speed and the digital native looking to root their tech know-how in real journalistic principles. Learn how to effectively blog, crowdsource, use mobile applications, mine databases, and expertly capture audio and video to report with immediacy, cultivate community, and tell compelling stories. Journalism Next will improve digital literacy, fast. Briggs begins with the basics and then explores specialized skills in multimedia so you can better manage online communities and build an online audience. Journalism Next is a quick read and roadmap you'll reference time and time again. Dive into any chapter and start mastering a new skill right away. And for today's journalist, who can afford to waste any time?
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Published:
Total Pages: 1386
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1979
Total Pages: 894
ISBN-13:
DOWNLOAD EBOOKAuthor: United States. Superintendent of Documents
Publisher:
Published: 1970
Total Pages: 1348
ISBN-13:
DOWNLOAD EBOOKAuthor: Chih-Tang Sah
Publisher: World Scientific
Published: 1996
Total Pages: 216
ISBN-13: 9789810228811
DOWNLOAD EBOOKThis Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book.This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students.