Speckle Metrology
Speckle Metrology

Author: R.S. Sirohi

Publisher: CRC Press

Published: 2020-08-18

Total Pages: 572

ISBN-13: 1000104958

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This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Advances in Speckle Metrology and Related Techniques
Advances in Speckle Metrology and Related Techniques

Author: Guillermo H. Kaufmann

Publisher: John Wiley & Sons

Published: 2011-01-25

Total Pages: 322

ISBN-13: 3527633871

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Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

Selected Papers on Electronic Speckle Pattern Interferometry
Selected Papers on Electronic Speckle Pattern Interferometry

Author: Peter Meinlschmidt

Publisher: SPIE-International Society for Optical Engineering

Published: 1996

Total Pages: 556

ISBN-13:

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This collection of papers offers the principles and practices of electronic speckle pattern interferometry (ESPI). It covers topics such as: parameters for design and optimization; measurment of static and dynamic surface displacements; pulsed lasers; and TV holography.

Selected Papers on Adaptive Optics and Speckle Imaging
Selected Papers on Adaptive Optics and Speckle Imaging

Author: Devon G. Crowe

Publisher: SPIE-International Society for Optical Engineering

Published: 1994

Total Pages: 444

ISBN-13:

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SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

Introduction to Optical Metrology
Introduction to Optical Metrology

Author: Rajpal S. Sirohi

Publisher: CRC Press

Published: 2017-07-12

Total Pages: 279

ISBN-13: 1351831119

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Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Optical Methods of Measurement
Optical Methods of Measurement

Author: Rajpal Sirohi

Publisher: CRC Press

Published: 2018-09-03

Total Pages: 316

ISBN-13: 1420017764

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Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.