Selected Papers on Scanning Acoustic Microscopy

Selected Papers on Scanning Acoustic Microscopy

Author: Butrus T. Khuri-Yakub

Publisher: Society of Photo Optical

Published: 1992

Total Pages: 545

ISBN-13: 9780819409829

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SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.


Acoustic Microscopy

Acoustic Microscopy

Author: Roman Gr. Maev

Publisher: John Wiley & Sons

Published: 2008-09-08

Total Pages: 291

ISBN-13: 3527623140

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This only and up-to-date monograph on this versatile method covers its use in a range of applications spanning the fields of physics, materials science, electrical engineering, medicine, and research and industry. Following an introduction, the highly experienced author goes on to investigate acoustic field structure, output signal formation in transmission raster acoustic microscopes and non-linear acoustic effects. Further chapters deal with the visco-elastic properties and microstructure of the model systems and composites used, as well as polymer composite materials and the microstructure and physical-mechanical properties of biological tissues. A handy reference for materials scientists, electrical engineers, radiologists, laboratory medics, test engineers, physicists, and graduate students.


Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author: Gerhard Huebschen

Publisher: Woodhead Publishing

Published: 2016-03-23

Total Pages: 322

ISBN-13: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials


Selected Papers on Near-field Optics

Selected Papers on Near-field Optics

Author: Suganda Jutamulia

Publisher: SPIE-International Society for Optical Engineering

Published: 2002

Total Pages: 552

ISBN-13:

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This work covers review papers on scanning near-field optical microscopy, early ideas and concepts, development of scanning near-field optical microscopy in the 1990s, theoretical analysis of near-field optics, and resolution of scanning near-field optical microscopy.


Selected Papers on Confocal Microscopy

Selected Papers on Confocal Microscopy

Author: Barry R. Masters

Publisher: SPIE-International Society for Optical Engineering

Published: 1996

Total Pages: 740

ISBN-13:

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SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.


Acoustical Imaging

Acoustical Imaging

Author: Hugh W. Jones

Publisher: Springer Science & Business Media

Published: 2013-03-08

Total Pages: 670

ISBN-13: 1468453203

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Volume 15 follows the format of earlier volumes in the series. The contents give the next installment in the varied aspects of acoustical imaging research. On this occasion, some emphasis was placed on the rela tionship of l1nderwater acoustics to acoustical imaging and a volume of papers under the title "Underwater Acoustics Proceedings from the 12th ICA Symposium held in Halifax," will appear at roughly the same time as this volume. There is no duplication in these volumes but they are in terlinked, at least to the extent that papers from common conference sessions appear in one or another volume. An innovation is the review paper presented at the beginning of the volume "A History of Acoustical Imaging," by G Wade. This fairly detailed review comes at a point in time when so much has been achieved and in some cases passed by, that a record of some of the earlier work might help to keep a balance with the large collections of research papers which have appeared in the many volumes.


Selected Papers on Scanning Probe Microscopes

Selected Papers on Scanning Probe Microscopes

Author: Yves Martin

Publisher: SPIE-International Society for Optical Engineering

Published: 1995

Total Pages: 508

ISBN-13:

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SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.


Acoustic Microscopy

Acoustic Microscopy

Author: Andrew Briggs

Publisher: Oxford University Press

Published: 2010

Total Pages: 383

ISBN-13: 0199232733

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For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.


Microelectronics Fialure Analysis Desk Reference, Seventh Edition

Microelectronics Fialure Analysis Desk Reference, Seventh Edition

Author: Tejinder Gandhi

Publisher: ASM International

Published: 2019-11-01

Total Pages: 719

ISBN-13: 1627082468

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.