Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Author: Osamu Ueda

Publisher: Springer Science & Business Media

Published: 2012-09-22

Total Pages: 618

ISBN-13: 1461443377

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.


III–V Compound Semiconductors

III–V Compound Semiconductors

Author: Tingkai Li

Publisher: CRC Press

Published: 2010-12-02

Total Pages: 606

ISBN-13: 1439815224

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Silicon-based microelectronics has steadily improved in various performance-to-cost metrics. But after decades of processor scaling, fundamental limitations and considerable new challenges have emerged. The integration of compound semiconductors is the leading candidate to address many of these issues and to continue the relentless pursuit of more powerful, cost-effective processors. III-V Compound Semiconductors: Integration with Silicon-Based Microelectronics covers recent progress in this area, addressing the two major revolutions occurring in the semiconductor industry: integration of compound semiconductors into Si microelectronics, and their fabrication on large-area Si substrates. The authors present a scientific and technological exploration of GaN, GaAs, and III-V compound semiconductor devices within Si microelectronics, building a fundamental foundation to help readers deal with relevant design and application issues. Explores silicon-based CMOS applications developed within the cutting-edge DARPA program Providing an overview of systems, devices, and their component materials, this book: Describes structure, phase diagrams, and physical and chemical properties of III-V and Si materials, as well as integration challenges Focuses on the key merits of GaN, including its importance in commercializing a new class of power diodes and transistors Analyzes more traditional III-V materials, discussing their merits and drawbacks for device integration with Si microelectronics Elucidates properties of III-V semiconductors and describes approaches to evaluate and characterize their attributes Introduces novel technologies for the measurement and evaluation of material quality and device properties Investigates state-of-the-art optical devices, LEDs, Si photonics, high-speed, high-power III-V materials and devices, III-V solar cell devices, and more Assembling the work of renowned experts, this is a reference for scientists and engineers working at the intersection of Si and compound semiconductor technology. Its comprehensive coverage is valuable for both students and experts in this burgeoning field.


Handbook of RF and Microwave Power Amplifiers

Handbook of RF and Microwave Power Amplifiers

Author: John L. B. Walker

Publisher: Cambridge University Press

Published: 2012

Total Pages: 705

ISBN-13: 0521760100

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This is a one-stop guide for circuit designers and system/device engineers, covering everything from CAD to reliability.


Handbook for III-V High Electron Mobility Transistor Technologies

Handbook for III-V High Electron Mobility Transistor Technologies

Author: D. Nirmal

Publisher: CRC Press

Published: 2019-05-14

Total Pages: 443

ISBN-13: 0429862539

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This book focusses on III-V high electron mobility transistors (HEMTs) including basic physics, material used, fabrications details, modeling, simulation, and other important aspects. It initiates by describing principle of operation, material systems and material technologies followed by description of the structure, I-V characteristics, modeling of DC and RF parameters of AlGaN/GaN HEMTs. The book also provides information about source/drain engineering, gate engineering and channel engineering techniques used to improve the DC-RF and breakdown performance of HEMTs. Finally, the book also highlights the importance of metal oxide semiconductor high electron mobility transistors (MOS-HEMT). Key Features Combines III-As/P/N HEMTs with reliability and current status in single volume Includes AC/DC modelling and (sub)millimeter wave devices with reliability analysis Covers all theoretical and experimental aspects of HEMTs Discusses AlGaN/GaN transistors Presents DC, RF and breakdown characteristics of HEMTs on various material systems using graphs and plots


On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

Author: Qiang Cui

Publisher: Springer

Published: 2015-03-10

Total Pages: 99

ISBN-13: 3319108190

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This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.


Predicting Semiconductor Business Trends After Moore's Law

Predicting Semiconductor Business Trends After Moore's Law

Author: Walden Rhines

Publisher:

Published: 2020-02-05

Total Pages: 110

ISBN-13:

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The semiconductor industry exhibited life cycles that were longer than the disk drive industry but had the same free market characteristics. Over time this unfettered competition followed trends in a worldwide market that could be quantified and used to predict the future. Over the past forty years or more, I've collected data and made presentations showing how the actual economics and technology of the semiconductor industry can be used to predict its future direction and magnitude. This book is built upon excerpts of presentations made during the last thirty years that analyze the business and technology of the semiconductor industry. In most cases, the figures in the book are copies of the original slides as they were presented during one or more of those presentations. In general, they show how predictable the semiconductor industry has been. They should also provide insight into the future of the industry.


CMOS

CMOS

Author: R. Jacob Baker

Publisher: John Wiley & Sons

Published: 2008

Total Pages: 1074

ISBN-13: 0470229411

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This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.